Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 029826/0225 | |
| Pages: | 7 |
| | Recorded: | 02/13/2013 | | |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
8
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Patent #:
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Issue Dt:
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03/26/1996
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Application #:
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08268149
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Filing Dt:
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06/28/1994
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Title:
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MICROPOLARIMETER, MICROSENSOR SYSTEM AND METHOD OF CHARACTERIZING THIN FILMS
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Patent #:
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Issue Dt:
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07/31/2001
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Application #:
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09485111
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Filing Dt:
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02/03/2000
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Title:
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MICROPOLARIMETER
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Patent #:
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Issue Dt:
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05/10/2005
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Application #:
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10120639
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Filing Dt:
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04/11/2002
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Publication #:
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Pub Dt:
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10/16/2003
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Title:
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Measurement box with module for measuring wafer characteristics
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Patent #:
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Issue Dt:
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09/28/2004
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Application #:
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10120641
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Filing Dt:
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04/11/2002
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Publication #:
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Pub Dt:
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10/16/2003
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Title:
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MEASURING MODULE
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Patent #:
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Issue Dt:
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10/11/2005
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Application #:
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10237909
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Filing Dt:
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09/09/2002
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Publication #:
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Pub Dt:
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10/16/2003
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Title:
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DEVICE FOR MEASURING SURFACE DEFECTS
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Patent #:
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Issue Dt:
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10/23/2007
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Application #:
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10913891
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Filing Dt:
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08/06/2004
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Publication #:
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Pub Dt:
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02/10/2005
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Title:
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HOLDING DEVICE FOR DISK-SHAPED OBJECTS
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Patent #:
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Issue Dt:
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05/21/2013
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Application #:
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12311371
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Filing Dt:
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08/05/2009
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Publication #:
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Pub Dt:
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01/07/2010
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Title:
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HOLDING AND TURNING DEVICE FOR TOUCH-SENSITIVE FLAT OBJECTS
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Patent #:
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Issue Dt:
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10/16/2012
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Application #:
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12657744
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Filing Dt:
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01/27/2010
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Publication #:
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Pub Dt:
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08/05/2010
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Title:
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INSPECTION DEVICE AND INSPECTION METHOD FOR THE OPTICAL EXAMINATION OF OBJECT SURFACES, PARTICULARLY OF WAFER SURFACES
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Assignee
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| GALILEO-GALILEI-STR. 28 |
| 55129 MAINZ, GERMANY |
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Correspondence name and address
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HUDAK SHUNK & FARINE CO. LPA
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DANIEL J. HUDAK, JR.
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2020 FRONT STREET, SUITE 307
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CUYAHOGA FALLS, OH 44221
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