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Patent Assignment Details
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Reel/Frame:007365/0226   Pages: 6
Recorded: 03/03/1995
Conveyance: SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 4
1
Patent #:
Issue Dt:
05/02/1989
Application #:
07145923
Filing Dt:
01/20/1988
Title:
NONINVASIVE METHOD AND APPARATUS FOR CHARACTERIZATION OF SEMICONDUCTORS
2
Patent #:
Issue Dt:
01/02/1990
Application #:
07171677
Filing Dt:
03/21/1988
Title:
APPARATUS FOR MAKING SURFACE PHOTOVOLTAGE MEASUREMENTS OF A SEMICONDUCTOR
3
Patent #:
Issue Dt:
02/25/1992
Application #:
07280973
Filing Dt:
12/07/1988
Title:
APPARATUS FOR MAKING SURFACE PHOTOVOLTAGE MEASUREMENTS OF A SEMICONDUCTOR
4
Patent #:
Issue Dt:
02/11/1992
Application #:
07553916
Filing Dt:
07/16/1990
Title:
APPARATUS AND METHOD FOR MAKING SURFACE PHOTOVOLTAGE MEASUREMENTS OF A SEMICONDUCTOR
Assignor
1
Exec Dt:
12/22/1994
Assignee
1
LAW OFFICE 01-24-02
100 FEDERAL STREET
BOSTON, MASSACHUSETTS 02100
Correspondence name and address
TERENCE MCGINNIS, ATTORNEYS
LAW OFFICE
01-24-02
100 FEDERAL STREET
BOSTON, MA 02110

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