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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 12 of 23
Pages: 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23

Patent #:	8772735	Issue Dt:	07/08/2014	Application #:	13666119	Filing Dt:	11/01/2012
Publication #:	US20130063029	Pub Dt:	03/14/2013
Title:	CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME

Patent #:	8654350	Issue Dt:	02/18/2014	Application #:	13672742	Filing Dt:	11/09/2012
Publication #:	US20130107247	Pub Dt:	05/02/2013
Title:	INSPECTING METHOD AND INSPECTING APPARATUS FOR SUBSTRATE SURFACE

Patent #:	8604425	Issue Dt:	12/10/2013	Application #:	13680630	Filing Dt:	11/19/2012
Publication #:	US20130075603	Pub Dt:	03/28/2013
Title:	SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH THE SAME

Patent #:	9566821	Issue Dt:	02/14/2017	Application #:	13680978	Filing Dt:	11/19/2012
Publication #:	US20130075036	Pub Dt:	03/28/2013
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	8611640	Issue Dt:	12/17/2013	Application #:	13692732	Filing Dt:	12/03/2012
Publication #:	US20130100446	Pub Dt:	04/25/2013
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	8971627	Issue Dt:	03/03/2015	Application #:	13696260	Filing Dt:	01/09/2013
Publication #:	US20130114898	Pub Dt:	05/09/2013
Title:	TEMPLATE MATCHING PROCESSING DEVICE AND TEMPLATE MATCHING PROCESSING PROGRAM

Patent #:	10512915	Issue Dt:	12/24/2019	Application #:	13696444	Filing Dt:	12/05/2012
Publication #:	US20130078712	Pub Dt:	03/28/2013
Title:	NUCLEIC ACID AMPLIFIER AND NUCLEIC ACID INSPECTION DEVICE EMPLOYING THE SAME

Patent #:	9150911	Issue Dt:	10/06/2015	Application #:	13696962	Filing Dt:	12/07/2012
Publication #:	US20130084629	Pub Dt:	04/04/2013
Title:	Nucleic Acid Analysis Reaction Cell and Nucleic Acid Analyzer

Patent #:	8853628	Issue Dt:	10/07/2014	Application #:	13697025	Filing Dt:	02/01/2013
Publication #:	US20130119250	Pub Dt:	05/16/2013
Title:	DEFECT INSPECTION METHOD, AND DEVICE THEREOF

Patent #:	9466040	Issue Dt:	10/11/2016	Application #:	13697741	Filing Dt:	01/24/2013
Publication #:	US20130117042	Pub Dt:	05/09/2013
Title:	AUTOMATIC ANALYSIS SYSTEM AND DEVICE MANAGEMENT SERVER

Patent #:	9360492	Issue Dt:	06/07/2016	Application #:	13698736	Filing Dt:	12/06/2012
Publication #:	US20130108508	Pub Dt:	05/02/2013
Title:	AUTOMATIC ANALYZER FOR BIOLOGICAL SAMPLES

Patent #:	9191628	Issue Dt:	11/17/2015	Application #:	13699167	Filing Dt:	01/29/2013
Publication #:	US20130120551	Pub Dt:	05/16/2013
Title:	Pattern Dimension Measurement Method, Pattern Dimension Measurement Device, Program for Causing Computer to Execute Pattern Dimension Measurement Method, and Recording Medium Having Same Recorded Thereon

Patent #:	9753048	Issue Dt:	09/05/2017	Application #:	13699646	Filing Dt:	11/23/2012
Publication #:	US20130061693	Pub Dt:	03/14/2013
Title:	SAMPLE TEST AUTOMATION SYSTEM

Patent #:	8942464	Issue Dt:	01/27/2015	Application #:	13700018	Filing Dt:	12/21/2012
Publication #:	US20130223723	Pub Dt:	08/29/2013
Title:	PATTERN MEASURING APPARATUS, AND PATTERN MEASURING METHOD AND PROGRAM

Patent #:	9702695	Issue Dt:	07/11/2017	Application #:	13700096	Filing Dt:	01/04/2013
Publication #:	US20130146763	Pub Dt:	06/13/2013
Title:	Image Processing Device, Charged Particle Beam Device, Charged Particle Beam Device Adjustment Sample, and Manufacturing Method Thereof

Patent #:	8830465	Issue Dt:	09/09/2014	Application #:	13700150	Filing Dt:	01/03/2013
Publication #:	US20130188184	Pub Dt:	07/25/2013
Title:	DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD

Patent #:	8670116	Issue Dt:	03/11/2014	Application #:	13700520	Filing Dt:	03/08/2013
Publication #:	US20130155400	Pub Dt:	06/20/2013
Title:	METHOD AND DEVICE FOR INSPECTING FOR DEFECTS

Patent #:	8711347	Issue Dt:	04/29/2014	Application #:	13701030	Filing Dt:	01/24/2013
Publication #:	US20130114078	Pub Dt:	05/09/2013
Title:	DEFECT INSPECTION METHOD AND DEVICE THEREFOR

Patent #:	8797522	Issue Dt:	08/05/2014	Application #:	13701399	Filing Dt:	01/04/2013
Publication #:	US20130114073	Pub Dt:	05/09/2013
Title:	LIGHT QUANTITY DETECTION METHOD AND DEVICE THEREFOR

Patent #:	8958062	Issue Dt:	02/17/2015	Application #:	13701834	Filing Dt:	08/26/2013
Publication #:	US20140009755	Pub Dt:	01/09/2014
Title:	DEFECT INSPECTION METHOD AND DEVICE USING SAME

Patent #:	9557326	Issue Dt:	01/31/2017	Application #:	13702175	Filing Dt:	02/19/2013
Publication #:	US20130143234	Pub Dt:	06/06/2013
Title:	SAMPLE ANALYZING DEVICE AND SAMPLE ANALYZING METHOD

Patent #:	9020237	Issue Dt:	04/28/2015	Application #:	13702674	Filing Dt:	12/07/2012
Publication #:	US20130077850	Pub Dt:	03/28/2013
Title:	METHOD FOR OPTIMIZING OBSERVED IMAGE CLASSIFICATION CRITERION AND IMAGE CLASSIFICATION APPARATUS

Patent #:	9535013	Issue Dt:	01/03/2017	Application #:	13702696	Filing Dt:	01/22/2013
Publication #:	US20130114880	Pub Dt:	05/09/2013
Title:	METHOD AND APPARATUS FOR INSPECTING DEFECT

Patent #:	8804110	Issue Dt:	08/12/2014	Application #:	13703414	Filing Dt:	01/30/2013
Publication #:	US20130141715	Pub Dt:	06/06/2013
Title:	FAULT INSPECTION DEVICE AND FAULT INSPECTION METHOD

Patent #:	8835883	Issue Dt:	09/16/2014	Application #:	13703926	Filing Dt:	12/13/2012
Publication #:	US20130082194	Pub Dt:	04/04/2013
Title:	CHARGED PARTICLE RADIATION DEVICE AND SOUNDPROOF COVER

Patent #:	9128071	Issue Dt:	09/08/2015	Application #:	13704247	Filing Dt:	12/14/2012
Publication #:	US20130091933	Pub Dt:	04/18/2013
Title:	LIQUID MIXING DEVICE AND LIQUID CHROMATOGRAPH

Patent #:	8563925	Issue Dt:	10/22/2013	Application #:	13722421	Filing Dt:	12/20/2012
Publication #:	US20130200256	Pub Dt:	08/08/2013
Title:	MASS SPECTROSCOPE AND ITS ADJUSTING METHOD

Patent #:	9076562	Issue Dt:	07/07/2015	Application #:	13726260	Filing Dt:	12/24/2012
Publication #:	US20130193322	Pub Dt:	08/01/2013
Title:	PHASE PLATE

Patent #:	8803084	Issue Dt:	08/12/2014	Application #:	13726294	Filing Dt:	12/24/2012
Publication #:	US20130161507	Pub Dt:	06/27/2013
Title:	MASS SPECTROMETER AND MASS SPECTROMETRY

Patent #:	8731275	Issue Dt:	05/20/2014	Application #:	13729635	Filing Dt:	12/28/2012
Publication #:	US20130114881	Pub Dt:	05/09/2013
Title:	METHOD AND APPARATUS FOR REVIEWING DEFECTS

Patent #:	8881067	Issue Dt:	11/04/2014	Application #:	13738795	Filing Dt:	01/10/2013
Publication #:	US20130195346	Pub Dt:	08/01/2013
Title:	METHOD AND APPARATUS FOR MONITORING CROSS-SECTIONAL SHAPE OF A PATTERN FORMED ON A SEMICONDUCTOR DEVICE

Patent #:	9514967	Issue Dt:	12/06/2016	Application #:	13742409	Filing Dt:	01/16/2013
Publication #:	US20140020831	Pub Dt:	01/23/2014
Title:	PLASMA PROCESSING APPARATUS

Patent #:	RE44840	Issue Dt:	04/15/2014	Application #:	13743245	Filing Dt:	01/16/2013
Title:	METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT THEREOF

Patent #:	RE44977	Issue Dt:	07/01/2014	Application #:	13743315	Filing Dt:	01/16/2013
Title:	METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT THEREOF

Patent #:	9097754	Issue Dt:	08/04/2015	Application #:	13748665	Filing Dt:	01/24/2013
Publication #:	US20140116985	Pub Dt:	05/01/2014
Title:	METHOD OF MANUFACTURING MAGNETORESISTIVE ELEMENT

Patent #:	8992724	Issue Dt:	03/31/2015	Application #:	13749784	Filing Dt:	01/25/2013
Publication #:	US20140148016	Pub Dt:	05/29/2014
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	8515155	Issue Dt:	08/20/2013	Application #:	13750761	Filing Dt:	01/25/2013
Publication #:	US20130136335	Pub Dt:	05/30/2013
Title:	PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS

Patent #:	8634070	Issue Dt:	01/21/2014	Application #:	13757119	Filing Dt:	02/01/2013
Publication #:	US20130258325	Pub Dt:	10/03/2013
Title:	METHOD AND APPARATUS FOR OPTICALLY INSPECTING A MAGNETIC DISK

Patent #:	8873031	Issue Dt:	10/28/2014	Application #:	13758243	Filing Dt:	02/04/2013
Publication #:	US20130258326	Pub Dt:	10/03/2013
Title:	METHOD AND APPARATUS FOR INSPECTING SURFACE OF A DISK

Patent #:	9287105	Issue Dt:	03/15/2016	Application #:	13760284	Filing Dt:	02/06/2013
Publication #:	US20130228677	Pub Dt:	09/05/2013
Title:	MASS SPECTROMETRIC SYSTEM

Patent #:	9017564	Issue Dt:	04/28/2015	Application #:	13761235	Filing Dt:	02/07/2013
Publication #:	US20140144873	Pub Dt:	05/29/2014
Title:	PLASMA ETCHING METHOD

Patent #:	8581186	Issue Dt:	11/12/2013	Application #:	13767822	Filing Dt:	02/14/2013
Publication #:	US20130206986	Pub Dt:	08/15/2013
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	8728946	Issue Dt:	05/20/2014	Application #:	13767913	Filing Dt:	02/15/2013
Title:	PLASMA ETCHING METHOD

Patent #:	10318805	Issue Dt:	06/11/2019	Application #:	13783333	Filing Dt:	03/03/2013
Publication #:	US20130278748	Pub Dt:	10/24/2013
Title:	PATTERN MATCHING METHOD AND APPARATUS

Patent #:	8618499	Issue Dt:	12/31/2013	Application #:	13788035	Filing Dt:	03/07/2013
Publication #:	US20140021348	Pub Dt:	01/23/2014
Title:	ELECTRON BEAM IRRADIATION APPARATUS

Patent #:	9018627	Issue Dt:	04/28/2015	Application #:	13788544	Filing Dt:	03/07/2013
Publication #:	US20130301041	Pub Dt:	11/14/2013
Title:	Inspection Apparatus

Patent #:	8921798	Issue Dt:	12/30/2014	Application #:	13789156	Filing Dt:	03/07/2013
Publication #:	US20140042332	Pub Dt:	02/13/2014
Title:	Defect Inspection Apparatus And Defect Inspection Method

Patent #:	8872106	Issue Dt:	10/28/2014	Application #:	13789346	Filing Dt:	03/07/2013
Publication #:	US20140021350	Pub Dt:	01/23/2014
Title:	PATTERN MEASURING APPARATUS

Patent #:	8729491	Issue Dt:	05/20/2014	Application #:	13789434	Filing Dt:	03/07/2013
Publication #:	US20140021366	Pub Dt:	01/23/2014
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	10317203	Issue Dt:	06/11/2019	Application #:	13789619	Filing Dt:	03/07/2013
Publication #:	US20130325397	Pub Dt:	12/05/2013
Title:	DIMENSION MEASURING APPARATUS AND COMPUTER READABLE MEDIUM

Patent #:	8835872	Issue Dt:	09/16/2014	Application #:	13806989	Filing Dt:	12/26/2012
Publication #:	US20130098274	Pub Dt:	04/25/2013
Title:	SAMPLE STAGE DEVICE

Patent #:	9257259	Issue Dt:	02/09/2016	Application #:	13807577	Filing Dt:	04/10/2013
Publication #:	US20130187045	Pub Dt:	07/25/2013
Title:	ELECTRON BEAM IRRADIATION METHOD AND SCANNING ELECTRONIC MICROSCOPE

Patent #:	9141879	Issue Dt:	09/22/2015	Application #:	13807664	Filing Dt:	04/10/2013
Publication #:	US20130216141	Pub Dt:	08/22/2013
Title:	PATTERN MATCHING METHOD, IMAGE PROCESSING DEVICE, AND COMPUTER PROGRAM

Patent #:	10233548	Issue Dt:	03/19/2019	Application #:	13808261	Filing Dt:	01/04/2013
Publication #:	US20130105302	Pub Dt:	05/02/2013
Title:	CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD

Patent #:	8822920	Issue Dt:	09/02/2014	Application #:	13808608	Filing Dt:	01/07/2013
Publication #:	US20130105690	Pub Dt:	05/02/2013
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9410543	Issue Dt:	08/09/2016	Application #:	13808660	Filing Dt:	01/07/2013
Publication #:	US20130104631	Pub Dt:	05/02/2013
Title:	PUMP FOR LIQUID CHROMATOGRAPH, AND LIQUID CHROMATOGRAPH

Patent #:	10352864	Issue Dt:	07/16/2019	Application #:	13808743	Filing Dt:	01/30/2013
Publication #:	US20130122596	Pub Dt:	05/16/2013
Title:	AUTOMATIC ANALYZER FOR IDENTIFYING A CAUSE OF ABNORMALITIES OF MEASUREMENT RESULTS

Patent #:	9110019	Issue Dt:	08/18/2015	Application #:	13809098	Filing Dt:	01/08/2013
Publication #:	US20130107256	Pub Dt:	05/02/2013
Title:	ANALYTICAL APPARATUS AND ANALYTICAL METHOD

Patent #:	9052301	Issue Dt:	06/09/2015	Application #:	13809161	Filing Dt:	01/08/2013
Publication #:	US20130115134	Pub Dt:	05/09/2013
Title:	AUTOMATIC ANALYZER

Patent #:	9255937	Issue Dt:	02/09/2016	Application #:	13809280	Filing Dt:	02/04/2013
Publication #:	US20130125671	Pub Dt:	05/23/2013
Title:	AUTOMATIC ANALYZER

Patent #:	8779360	Issue Dt:	07/15/2014	Application #:	13809923	Filing Dt:	01/14/2013
Publication #:	US20130112893	Pub Dt:	05/09/2013
Title:	CHARGED PARTICLE BEAM DEVICE, DEFECT OBSERVATION DEVICE, AND MANAGEMENT SERVER

Patent #:	9483441	Issue Dt:	11/01/2016	Application #:	13809956	Filing Dt:	02/21/2013
Publication #:	US20130151189	Pub Dt:	06/13/2013
Title:	QUALITY CONTROL SYSTEM

Patent #:	8588499	Issue Dt:	11/19/2013	Application #:	13810034	Filing Dt:	03/29/2013
Publication #:	US20130202180	Pub Dt:	08/08/2013
Title:	IMAGE PROCESSING METHOD, IMAGE PROCESSING SYSTEM, AND X-RAY COMPUTED TOMOGRAPHY SYSTEM

Patent #:	8754664	Issue Dt:	06/17/2014	Application #:	13810512	Filing Dt:	01/16/2013
Publication #:	US20130112871	Pub Dt:	05/09/2013
Title:	Inspection Method and Device

Patent #:	9714455	Issue Dt:	07/25/2017	Application #:	13810954	Filing Dt:	01/18/2013
Publication #:	US20130130229	Pub Dt:	05/23/2013
Title:	Method for Detecting Nucleic Acid Amplification in Sample and Device Therefor

Patent #:	8847173	Issue Dt:	09/30/2014	Application #:	13811392	Filing Dt:	01/22/2013
Publication #:	US20130119252	Pub Dt:	05/16/2013
Title:	GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AND EMITTER TIP AND METHOD FOR MANUFACTURING SAME

Patent #:	9114970	Issue Dt:	08/25/2015	Application #:	13811940	Filing Dt:	01/24/2013
Publication #:	US20130121882	Pub Dt:	05/16/2013
Title:	DISPENSING DEVICE AND NUCLEIC ACID ANALYZER

Patent #:	8704166	Issue Dt:	04/22/2014	Application #:	13812125	Filing Dt:	04/05/2013
Publication #:	US20130181124	Pub Dt:	07/18/2013
Title:	ION TRAP TYPE MASS SPECTROMETER AND MASS SPECTROMETRY

Patent #:	8704175	Issue Dt:	04/22/2014	Application #:	13812451	Filing Dt:	01/25/2013
Publication #:	US20130175447	Pub Dt:	07/11/2013
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9562809	Issue Dt:	02/07/2017	Application #:	13812801	Filing Dt:	01/28/2013
Publication #:	US20130176563	Pub Dt:	07/11/2013
Title:	Biopolymer Optical Analysis Device and Method

Patent #:	8933422	Issue Dt:	01/13/2015	Application #:	13812842	Filing Dt:	04/05/2013
Publication #:	US20130200271	Pub Dt:	08/08/2013
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	9230182	Issue Dt:	01/05/2016	Application #:	13812847	Filing Dt:	01/28/2013
Publication #:	US20130129200	Pub Dt:	05/23/2013
Title:	DEVICE FOR SETTING IMAGE ACQUISITION CONDITIONS, AND COMPUTER PROGRAM

Patent #:	8841612	Issue Dt:	09/23/2014	Application #:	13812899	Filing Dt:	01/29/2013
Publication #:	US20130126733	Pub Dt:	05/23/2013
Title:	Charged Particle Beam Microscope

Patent #:	9024275	Issue Dt:	05/05/2015	Application #:	13816601	Filing Dt:	02/12/2013
Publication #:	US20130140458	Pub Dt:	06/06/2013
Title:	Specimen Holder for Charged-Particle Beam Apparatus

Patent #:	8972044	Issue Dt:	03/03/2015	Application #:	13816897	Filing Dt:	03/01/2013
Publication #:	US20130197690	Pub Dt:	08/01/2013
Title:	AUTOMATED SAMPLE TEST SYSTEM, AND METHOD FOR CONTROLLING SAME

Patent #:	8629979	Issue Dt:	01/14/2014	Application #:	13817545	Filing Dt:	02/19/2013
Publication #:	US20130148116	Pub Dt:	06/13/2013
Title:	INSPECTION SYSTEM, INSPECTION METHOD, AND PROGRAM

Patent #:	8956568	Issue Dt:	02/17/2015	Application #:	13817547	Filing Dt:	03/01/2013
Publication #:	US20130149079	Pub Dt:	06/13/2013
Title:	SAMPLE TRANSFER MECHANISM

Patent #:	8791413	Issue Dt:	07/29/2014	Application #:	13817644	Filing Dt:	02/19/2013
Publication #:	US20130146765	Pub Dt:	06/13/2013
Title:	Charged Particle Beam Device and Sample Observation Method Using a rotating detector

Patent #:	9275829	Issue Dt:	03/01/2016	Application #:	13818094	Filing Dt:	02/20/2013
Publication #:	US20130141563	Pub Dt:	06/06/2013
Title:	IMAGE FORMING DEVICE AND COMPUTER PROGRAM

Patent #:	9165214	Issue Dt:	10/20/2015	Application #:	13818097	Filing Dt:	02/20/2013
Publication #:	US20130148876	Pub Dt:	06/13/2013
Title:	IMAGE PROCESSING DEVICE AND COMPUTER PROGRAM

Patent #:	8884207	Issue Dt:	11/11/2014	Application #:	13821246	Filing Dt:	03/07/2013
Publication #:	US20130161490	Pub Dt:	06/27/2013
Title:	PHOTOELECTRIC CONVERSION ELEMENT, DEFECT INSPECTING APPARATUS, AND DEFECT INSPECTING METHOD

Patent #:	8564767	Issue Dt:	10/22/2013	Application #:	13821468	Filing Dt:	04/23/2013
Publication #:	US20130208270	Pub Dt:	08/15/2013
Title:	DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD

Patent #:	9470608	Issue Dt:	10/18/2016	Application #:	13825982	Filing Dt:	04/27/2013
Publication #:	US20130202486	Pub Dt:	08/08/2013
Title:	SAMPLE PROCESSING SYSTEM

Patent #:	8733282	Issue Dt:	05/27/2014	Application #:	13829676	Filing Dt:	03/14/2013
Publication #:	US20130199728	Pub Dt:	08/08/2013
Title:	PLASMA PROCESSING APPARATUS

Patent #:	8755041	Issue Dt:	06/17/2014	Application #:	13846441	Filing Dt:	03/18/2013
Publication #:	US20130343632	Pub Dt:	12/26/2013
Title:	DEFECT INSPECTION METHOD AND APPARATUS

Patent #:	9000366	Issue Dt:	04/07/2015	Application #:	13855977	Filing Dt:	04/03/2013
Publication #:	US20130264479	Pub Dt:	10/10/2013
Title:	METHOD AND APPARATUS FOR MEASURING DISPLACEMENT BETWEEN PATTERNS AND SCANNING ELECTRON MICROSCOPE INSTALLING UNIT FOR MEASURING DISPLACEMENT BETWEEN PATTERNS

Patent #:	9507328	Issue Dt:	11/29/2016	Application #:	13859812	Filing Dt:	04/10/2013
Publication #:	US20130274908	Pub Dt:	10/17/2013
Title:	PROCESSING CHAMBER ALLOCATION SETTING DEVICE AND PROCESSING CHAMBER ALLOCATION SETTING PROGRAM

Patent #:	8951385	Issue Dt:	02/10/2015	Application #:	13864317	Filing Dt:	04/17/2013
Publication #:	US20130267098	Pub Dt:	10/10/2013
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9336587	Issue Dt:	05/10/2016	Application #:	13868352	Filing Dt:	04/23/2013
Publication #:	US20140003703	Pub Dt:	01/02/2014
Title:	SEMICONDUCTOR CIRCUIT PATTERN MEASURING APPARATUS AND METHOD

Patent #:	8785890	Issue Dt:	07/22/2014	Application #:	13871624	Filing Dt:	04/26/2013
Publication #:	US20130228701	Pub Dt:	09/05/2013
Title:	CHARGED PARTICLE BEAM APPARATUS PERMITTING HIGH-RESOLUTION AND HIGH-CONTRAST OBSERVATION

Patent #:	8784750	Issue Dt:	07/22/2014	Application #:	13872416	Filing Dt:	04/29/2013
Publication #:	US20130236360	Pub Dt:	09/12/2013
Title:	AUTOMATIC ANALYZER USING A SAMPLE CONTAINER HAVING AN INFORMATION RECORDING MEMBER

Patent #:	9390597	Issue Dt:	07/12/2016	Application #:	13876577	Filing Dt:	04/23/2013
Publication #:	US20130201019	Pub Dt:	08/08/2013
Title:	LABORATORY AUTOMATION APPARATUS, AUTOMATED ANALYTICAL APPARATUS AND SYSTEM

Patent #:	8698079	Issue Dt:	04/15/2014	Application #:	13877710	Filing Dt:	05/17/2013
Publication #:	US20130221217	Pub Dt:	08/29/2013
Title:	METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOATING ON LIQUID SURFACE

Patent #:	9123516	Issue Dt:	09/01/2015	Application #:	13877717	Filing Dt:	05/31/2013
Publication #:	US20130240726	Pub Dt:	09/19/2013
Title:	MULTIPOLE SEGMENTS ALIGNED IN AN OFFSET MANNER IN A MASS SPECTROMETER

Patent #:	8621400	Issue Dt:	12/31/2013	Application #:	13877922	Filing Dt:	04/05/2013
Publication #:	US20130191807	Pub Dt:	07/25/2013
Title:	METHOD OF EVALUATING SYSTEMATIC DEFECT, AND APPARATUS THEREFOR

Patent #:	8729497	Issue Dt:	05/20/2014	Application #:	13877947	Filing Dt:	04/05/2013
Publication #:	US20130193343	Pub Dt:	08/01/2013
Title:	SAMPLE DEVICE FOR CHARGED PARTICLE BEAM

Patent #:	9354049	Issue Dt:	05/31/2016	Application #:	13880429	Filing Dt:	06/07/2013
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Title:	SHAPE MEASUREMENT METHOD, AND SYSTEM THEREFOR

Patent #:	9148631	Issue Dt:	09/29/2015	Application #:	13881378	Filing Dt:	05/30/2013
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Title:	DEFECT INSPECTION METHOD AND DEVICE THEREFOR

Patent #:	9329034	Issue Dt:	05/03/2016	Application #:	13882134	Filing Dt:	06/25/2013
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Title:	PATTERN DETERMINATION DEVICE AND COMPUTER PROGRAM

100

Patent #:	9183622	Issue Dt:	11/10/2015	Application #:	13882141	Filing Dt:	07/02/2013
Publication #:	US20130279793	Pub Dt:	10/24/2013
Title:	IMAGE PROCESSING APPARATUS

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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