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Reel/Frame:018202/0236   Pages: 4
Recorded: 09/05/2006
Attorney Dkt #:29756-1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
10961798
Filing Dt:
10/08/2004
Publication #:
Pub Dt:
05/19/2005
Title:
Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing
Assignors
1
Exec Dt:
09/05/2006
2
Exec Dt:
09/05/2006
3
Exec Dt:
09/01/2006
4
Exec Dt:
09/01/2006
5
Exec Dt:
09/01/2006
Assignee
1
3626 WEST LIBERTY ROAD
ANN ARBOR, MICHIGAN 48103
Correspondence name and address
JON E. SHACKELFORD
38525 WOODWARD AVENUE
SUITE 2000
BLOOMFIELD HILLS, MI 48304-2970

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