Patent Assignment Details
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| Reel/Frame: | 010682/0239 | |
| Pages: | 3 |
| | Recorded: | 04/06/2000 | | |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT RECEIVING PARTY'S NAME. AN ASSIGNMENT PREVIOUSLY RECORDED AT REEL 010450, FRAME 0376. |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/09/2002
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Application #:
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09458819
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Filing Dt:
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12/13/1999
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Title:
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RESIST MARK HAVING MEASUREMENT MARKS FOR MEASURING THE ACCURACY OF OVERLAY OF A PHOTOMASK DISPOSED ON SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER HAVING IT
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Assignee
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| 7-12, TORANOMON 1-CHOME, MINATO-KU |
| TOKYO 105, JAPAN |
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Correspondence name and address
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OKI AMERICA, INC.
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1725 K STREET, N.W., SUITE 1110
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WASHINGTON, D.C. 20006
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