Patent Assignment Details
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| Reel/Frame: | 021309/0241 | |
| Pages: | 3 |
| | Recorded: | 07/29/2008 | | |
| Attorney Dkt #: | 11106/111 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/20/2014
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Application #:
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11936417
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Filing Dt:
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11/07/2007
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Publication #:
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Pub Dt:
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11/27/2008
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Title:
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METHOD OF MANUFACTURING SAMPLE FOR ATOM PROBE ANALYSIS BY FIB AND FOCUSED ION BEAM APPARATUS IMPLEMENTING THE SAME
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Assignee
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| 8, NAKASE 1-CHOME, MIHAMA-KU |
| CHIBA-SHI, CHIBA, JAPAN 261-8507 |
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Correspondence name and address
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TADASHI HORIE/KUMIKO JOVANOVICH
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BRINKS HOFER GILSON & LIONE
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P.O. BOX 10395
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CHICAGO, IL 60610
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