USPTO Assignments on the Web

	United States Patent and Trademark Office
	Home\|Site Index\|Search\|Guides\|Contacts\|eBusiness\|eBiz alerts\|News\|Help

Assignments on the Web > Patent Query

Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	056004/0248			Pages:	8
		Recorded:	04/13/2021
Attorney Dkt #:	1003-1002.1-1050
Conveyance:	CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).

Total properties: 34

Patent #:	6512814	Issue Dt:	01/28/2003	Application #:	09833902	Filing Dt:	04/12/2001
Publication #:	US20020150208	Pub Dt:	10/17/2002
Title:	X-RAY REFLECTOMETER

Patent #:	6778633	Issue Dt:	08/17/2004	Application #:	09937609	Filing Dt:	01/28/2002
Title:	METHOD AND APPARATUS FOR PROLONGING THE LIFE OF AN X-RAY TARGET

Patent #:	6782076	Issue Dt:	08/24/2004	Application #:	10004785	Filing Dt:	12/07/2001
Publication #:	US20030108152	Pub Dt:	06/12/2003
Title:	X-RAY TOPOGRAPHIC SYSTEM

Patent #:	6535575	Issue Dt:	03/18/2003	Application #:	10077125	Filing Dt:	02/14/2002
Publication #:	US20020150209	Pub Dt:	10/17/2002
Title:	PULSED X-RAY REFLECTOMETER

Patent #:	6680996	Issue Dt:	01/20/2004	Application #:	10078640	Filing Dt:	02/19/2002
Publication #:	US20030156682	Pub Dt:	08/21/2003
Title:	DUAL-WAVELENGTH X-RAY REFLECTOMETRY

Patent #:	6639968	Issue Dt:	10/28/2003	Application #:	10300504	Filing Dt:	11/20/2002
Publication #:	US20030072413	Pub Dt:	04/17/2003
Title:	X-RAY REFLECTOMETER

Patent #:	6947520	Issue Dt:	09/20/2005	Application #:	10313280	Filing Dt:	12/06/2002
Publication #:	US20040109531	Pub Dt:	06/10/2004
Title:	BEAM CENTERING AND ANGLE CALIBRATION FOR X-RAY REFLECTOMETRY

Patent #:	6895075	Issue Dt:	05/17/2005	Application #:	10364883	Filing Dt:	02/12/2003
Publication #:	US20040156474	Pub Dt:	08/12/2004
Title:	X-RAY REFLECTOMETRY WITH SMALL-ANGLE SCATTERING MEASUREMENT

Patent #:	6881965	Issue Dt:	04/19/2005	Application #:	10627863	Filing Dt:	07/28/2003
Publication #:	US20040089818	Pub Dt:	05/13/2004
Title:	MULTI-FOIL OPTIC

Patent #:	6895071	Issue Dt:	05/17/2005	Application #:	10635365	Filing Dt:	08/06/2003
Publication #:	US20040028186	Pub Dt:	02/12/2004
Title:	X-RAY REFLECTOMETER

Patent #:	7023954	Issue Dt:	04/04/2006	Application #:	10673996	Filing Dt:	09/29/2003
Publication #:	US20050069090	Pub Dt:	03/31/2005
Title:	OPTICAL ALIGNMENT OF X-RAY MICROANALYZERS

Patent #:	7062013	Issue Dt:	06/13/2006	Application #:	10689314	Filing Dt:	10/20/2003
Publication #:	US20040131151	Pub Dt:	07/08/2004
Title:	X-RAY REFLECTOMETRY OF THIN FILM LAYERS WITH ENHANCED ACCURACY

Patent #:	7035375	Issue Dt:	04/25/2006	Application #:	10702413	Filing Dt:	11/05/2003
Publication #:	US20050094766	Pub Dt:	05/05/2005
Title:	X-RAY SCATTERING WITH A POLYCHROMATIC SOURCE

Patent #:	6907108	Issue Dt:	06/14/2005	Application #:	10761023	Filing Dt:	01/20/2004
Publication #:	US20040151278	Pub Dt:	08/05/2004
Title:	DUAL-WAVELENGTH X-RAY MONOCHROMATOR

Patent #:	7068753	Issue Dt:	06/27/2006	Application #:	10902177	Filing Dt:	07/30/2004
Publication #:	US20060023836	Pub Dt:	02/02/2006
Title:	ENHANCEMENT OF X-RAY REFLECTOMETRY BY MEASUREMENT OF DIFFUSE REFLECTIONS

Patent #:	7120228	Issue Dt:	10/10/2006	Application #:	10946426	Filing Dt:	09/21/2004
Publication #:	US20060062350	Pub Dt:	03/23/2006
Title:	COMBINED X-RAY REFLECTOMETER AND DIFFRACTOMETER

Patent #:	7474732	Issue Dt:	01/06/2009	Application #:	11000044	Filing Dt:	12/01/2004
Publication #:	US20060115046	Pub Dt:	06/01/2006
Title:	CALIBRATION OF X-RAY REFLECTOMETRY SYSTEM

Patent #:	7076024	Issue Dt:	07/11/2006	Application #:	11000053	Filing Dt:	12/01/2004
Publication #:	US20060115047	Pub Dt:	06/01/2006
Title:	X-RAY APPARATUS WITH DUAL MONOCHROMATORS

Patent #:	7110491	Issue Dt:	09/19/2006	Application #:	11018352	Filing Dt:	12/22/2004
Publication #:	US20060133570	Pub Dt:	06/22/2006
Title:	MEASUREMENT OF CRITICAL DIMENSIONS USING X-RAY DIFFRACTION IN REFLECTION MODE

Patent #:	7103142	Issue Dt:	09/05/2006	Application #:	11065737	Filing Dt:	02/24/2005
Publication #:	US20060188062	Pub Dt:	08/24/2006
Title:	MATERIAL ANALYSIS USING MULTIPLE X-RAY REFLECTOMETRY MODELS

Patent #:	7245695	Issue Dt:	07/17/2007	Application #:	11103071	Filing Dt:	04/11/2005
Publication #:	US20060227931	Pub Dt:	10/12/2006
Title:	DETECTION OF DISHING AND TILTING USING X-RAY FLUORESCENCE

Patent #:	7113566	Issue Dt:	09/26/2006	Application #:	11181746	Filing Dt:	07/15/2005
Title:	ENHANCING RESOLUTION OF X-RAY MEASUREMENTS BY SAMPLE MOTION

Patent #:	7551719	Issue Dt:	06/23/2009	Application #:	11200857	Filing Dt:	08/10/2005
Publication #:	US20060062351	Pub Dt:	03/23/2006
Title:	MULTIFUNCTION X-RAY ANALYSIS SYSTEM

Patent #:	7130376	Issue Dt:	10/31/2006	Application #:	11297837	Filing Dt:	12/07/2005
Publication #:	US20060153333	Pub Dt:	07/13/2006
Title:	X-RAY REFLECTOMETRY OF THIN FILM LAYERS WITH ENHANCED ACCURACY

Patent #:	7481579	Issue Dt:	01/27/2009	Application #:	11389490	Filing Dt:	03/27/2006
Publication #:	US20070224518	Pub Dt:	09/27/2007
Title:	OVERLAY METROLOGY USING X-RAYS

Patent #:	7231016	Issue Dt:	06/12/2007	Application #:	11396719	Filing Dt:	04/04/2006
Publication #:	US20060182220	Pub Dt:	08/17/2006
Title:	EFFICIENT MEASUREMENT OF DIFFUSE X-RAY REFLECTIONS

Patent #:	7483513	Issue Dt:	01/27/2009	Application #:	11487433	Filing Dt:	07/17/2006
Publication #:	US20060274886	Pub Dt:	12/07/2006
Title:	MEASUREMENT OF PROPERTIES OF THIN FILMS ON SIDEWALLS

Patent #:	7406153	Issue Dt:	07/29/2008	Application #:	11503979	Filing Dt:	08/15/2006
Publication #:	US20080043911	Pub Dt:	02/21/2008
Title:	CONTROL OF X-RAY BEAM SPOT SIZE

Patent #:	7453985	Issue Dt:	11/18/2008	Application #:	11822231	Filing Dt:	07/03/2007
Publication #:	US20080043914	Pub Dt:	02/21/2008
Title:	CONTROL OF X-RAY BEAM SPOT SIZE

Patent #:	7600916	Issue Dt:	10/13/2009	Application #:	11892005	Filing Dt:	08/17/2007
Publication #:	US20070286344	Pub Dt:	12/13/2007
Title:	TARGET ALIGNMENT FOR X-RAY SCATTERING MEASUREMENTS

Patent #:	7680243	Issue Dt:	03/16/2010	Application #:	11896909	Filing Dt:	09/06/2007
Publication #:	US20090067573	Pub Dt:	03/12/2009
Title:	X-RAY MEASUREMENT OF PROPERTIES OF NANO-PARTICLES

Patent #:	7653174	Issue Dt:	01/26/2010	Application #:	12003215	Filing Dt:	12/20/2007
Publication #:	US20080159475	Pub Dt:	07/03/2008
Title:	INSPECTION OF SMALL FEATURES USING X-RAY FLUORESCENCE

Patent #:	7649978	Issue Dt:	01/19/2010	Application #:	12232259	Filing Dt:	09/12/2008
Publication #:	US20090074141	Pub Dt:	03/19/2009
Title:	AUTOMATED SELECTION OF X-RAY REFLECTOMETRY MEASUREMENT LOCATIONS

Patent #:	7804934	Issue Dt:	09/28/2010	Application #:	12272050	Filing Dt:	11/17/2008
Publication #:	US20090074137	Pub Dt:	03/19/2009
Title:	ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF

Assignor

JORDAN VALLEY SEMICONDUCTORS LTD.

Exec Dt:

07/18/2019

Assignee

BRUKER TECHNOLOGIES LTD.

6 HAMECHKAR STREET

P.O. BOX 103

MIGDAL HAEMEK, ISRAEL 2306990

Correspondence name and address
	KLIGLER & ASSOCIATES PATENT ATTORNEYS LTD.
	P.O. BOX 57651
	TEL AVIV, 6157601 ISRAEL

Search Results as of: 09/22/2024 01:14 PM

If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6

Web interface last modified: August 25, 2017 v.2.6