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Reel/Frame:052398/0249   Pages: 14
Recorded: 04/14/2020
Attorney Dkt #:107532.GA051US
Conveyance: CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Total properties: 170
Page 2 of 2
Pages: 1 2
1
Patent #:
10840059
Issue Dt:
11/17/2020
Application #:
16317386
Filing Dt:
01/11/2019
Publication #:
US20190311876
Pub Dt:
10/10/2019
Title:
Charged Particle Radiation Device
2
Patent #:
10551346
Issue Dt:
02/04/2020
Application #:
16323168
Filing Dt:
02/04/2019
Publication #:
US20190178841
Pub Dt:
06/13/2019
Title:
Ion Analysis Device
3
Patent #:
11176668
Issue Dt:
11/16/2021
Application #:
16323808
Filing Dt:
02/07/2019
Publication #:
US20190172206
Pub Dt:
06/06/2019
Title:
Image Diagnosis Assisting Apparatus, Image Diagnosis Assisting Method and Sample Analyzing System
4
Patent #:
10690688
Issue Dt:
06/23/2020
Application #:
16325885
Filing Dt:
02/15/2019
Publication #:
US20190212351
Pub Dt:
07/11/2019
Title:
Automatic Analyzer
5
Patent #:
11802763
Issue Dt:
10/31/2023
Application #:
16326397
Filing Dt:
02/19/2019
Publication #:
US20190186910
Pub Dt:
06/20/2019
Title:
Pattern Measurement Device and Computer Program
6
Patent #:
10753870
Issue Dt:
08/25/2020
Application #:
16328818
Filing Dt:
02/27/2019
Publication #:
US20190212262
Pub Dt:
07/11/2019
Title:
Automatic Analysis Apparatus Including A Reaction Container Holding Part Having A Surface That Reflects Light Emitted From A Light Source
7
Patent #:
11519924
Issue Dt:
12/06/2022
Application #:
16329021
Filing Dt:
02/27/2019
Publication #:
US20190204346
Pub Dt:
07/04/2019
Title:
Automatic Analysis Device
8
Patent #:
11424098
Issue Dt:
08/23/2022
Application #:
16333115
Filing Dt:
03/13/2019
Publication #:
US20190371568
Pub Dt:
12/05/2019
Title:
Pattern Measurement Device, and Computer Program
9
Patent #:
11360110
Issue Dt:
06/14/2022
Application #:
16333862
Filing Dt:
03/15/2019
Publication #:
US20190265261
Pub Dt:
08/29/2019
Title:
Sample Test Automation System
10
Patent #:
10614994
Issue Dt:
04/07/2020
Application #:
16335309
Filing Dt:
03/21/2019
Publication #:
US20190279837
Pub Dt:
09/12/2019
Title:
Electron Microscope
11
Patent #:
NONE
Issue Dt:
Application #:
16337694
Filing Dt:
03/28/2019
Publication #:
US20200033122
Pub Dt:
01/30/2020
Title:
Pattern Evaluation Apparatus and Computer Program
12
Patent #:
11120967
Issue Dt:
09/14/2021
Application #:
16345520
Filing Dt:
04/26/2019
Publication #:
US20190279838
Pub Dt:
09/12/2019
Title:
Charged Particle Beam Apparatus and Sample Observation Method Using Superimposed Comparison Image Display
13
Patent #:
11152186
Issue Dt:
10/19/2021
Application #:
16354670
Filing Dt:
03/15/2019
Publication #:
US20190311875
Pub Dt:
10/10/2019
Title:
Charged Particle Beam Device
14
Patent #:
11133148
Issue Dt:
09/28/2021
Application #:
16398921
Filing Dt:
04/30/2019
Publication #:
US20190362929
Pub Dt:
11/28/2019
Title:
Scanning Electron Microscope
15
Patent #:
10903041
Issue Dt:
01/26/2021
Application #:
16424803
Filing Dt:
05/29/2019
Publication #:
US20190378679
Pub Dt:
12/12/2019
Title:
Pattern Measuring Method, Pattern Measuring Tool and Computer Readable Medium
16
Patent #:
10714304
Issue Dt:
07/14/2020
Application #:
16427698
Filing Dt:
05/31/2019
Publication #:
US20190304740
Pub Dt:
10/03/2019
Title:
Charged Particle Beam Apparatus
17
Patent #:
10770266
Issue Dt:
09/08/2020
Application #:
16436297
Filing Dt:
06/10/2019
Publication #:
US20200035449
Pub Dt:
01/30/2020
Title:
CHARGED PARTICLE BEAM DEVICE AND CAPTURING CONDITION ADJUSTING METHOD IN CHARGED PARTICLE BEAM DEVICE
18
Patent #:
10636623
Issue Dt:
04/28/2020
Application #:
16439005
Filing Dt:
06/12/2019
Publication #:
US20190295802
Pub Dt:
09/26/2019
Title:
ION BEAM DEVICE
19
Patent #:
11162965
Issue Dt:
11/02/2021
Application #:
16463965
Filing Dt:
05/24/2019
Publication #:
US20200378997
Pub Dt:
12/03/2020
Title:
Automatic Analyzer
20
Patent #:
11262371
Issue Dt:
03/01/2022
Application #:
16465764
Filing Dt:
05/31/2019
Publication #:
US20200072856
Pub Dt:
03/05/2020
Title:
Automatic Analyzer and Automatic Analysis Method
21
Patent #:
11353473
Issue Dt:
06/07/2022
Application #:
16466215
Filing Dt:
06/03/2019
Publication #:
US20200064364
Pub Dt:
02/27/2020
Title:
Automatic Analyzer and Automatic Analysis Method
22
Patent #:
11486887
Issue Dt:
11/01/2022
Application #:
16468761
Filing Dt:
06/12/2019
Publication #:
US20190317119
Pub Dt:
10/17/2019
Title:
Automated Analyzer
23
Patent #:
11056310
Issue Dt:
07/06/2021
Application #:
16471291
Filing Dt:
06/19/2019
Publication #:
US20190393014
Pub Dt:
12/26/2019
Title:
Charged-Particle Beam Device
24
Patent #:
10832976
Issue Dt:
11/10/2020
Application #:
16473427
Filing Dt:
06/25/2019
Title:
CHARGED PARTICLE BEAM DEVICE AND OPTICAL EXAMINATION DEVICE
25
Patent #:
11335533
Issue Dt:
05/17/2022
Application #:
16474846
Filing Dt:
06/28/2019
Publication #:
US20210134555
Pub Dt:
05/06/2021
Title:
CHARGED PARTICLE BEAM DEVICE
26
Patent #:
10937628
Issue Dt:
03/02/2021
Application #:
16477573
Filing Dt:
07/12/2019
Publication #:
US20190362938
Pub Dt:
11/28/2019
Title:
Charged Particle Beam Device
27
Patent #:
10991542
Issue Dt:
04/27/2021
Application #:
16477986
Filing Dt:
07/15/2019
Publication #:
US20190362931
Pub Dt:
11/28/2019
Title:
CHARGED PARTICLE BEAM DEVICE
28
Patent #:
10790111
Issue Dt:
09/29/2020
Application #:
16479356
Filing Dt:
07/19/2019
Publication #:
US20190355541
Pub Dt:
11/21/2019
Title:
Charged-Particle Beam Device
29
Patent #:
10707046
Issue Dt:
07/07/2020
Application #:
16480405
Filing Dt:
07/24/2019
Publication #:
US20190385809
Pub Dt:
12/19/2019
Title:
Electron Source and Electron Beam Device Using the Same
30
Patent #:
11239051
Issue Dt:
02/01/2022
Application #:
16481918
Filing Dt:
07/30/2019
Publication #:
US20190378687
Pub Dt:
12/12/2019
Title:
Charged Particle Beam Device
31
Patent #:
11139144
Issue Dt:
10/05/2021
Application #:
16482765
Filing Dt:
08/01/2019
Publication #:
US20190355552
Pub Dt:
11/21/2019
Title:
Charged Particle Beam Apparatus
32
Patent #:
11169168
Issue Dt:
11/09/2021
Application #:
16483799
Filing Dt:
08/06/2019
Publication #:
US20200191814
Pub Dt:
06/18/2020
Title:
Automated Analyzer
33
Patent #:
10603667
Issue Dt:
03/31/2020
Application #:
16484185
Filing Dt:
08/07/2019
Publication #:
US20190351424
Pub Dt:
11/21/2019
Title:
Automatic Analysis Device and Cleaning Mechanism in Automatic Analysis Device
34
Patent #:
11150214
Issue Dt:
10/19/2021
Application #:
16484696
Filing Dt:
08/08/2019
Publication #:
US20200057022
Pub Dt:
02/20/2020
Title:
Capillary Electrophoresis Apparatus and Thermostat
35
Patent #:
NONE
Issue Dt:
Application #:
16487545
Filing Dt:
08/21/2019
Publication #:
US20190383842
Pub Dt:
12/19/2019
Title:
Automatic Analyzer
36
Patent #:
10923315
Issue Dt:
02/16/2021
Application #:
16487551
Filing Dt:
08/21/2019
Publication #:
US20190378685
Pub Dt:
12/12/2019
Title:
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF ADJUSTING CHARGED PARTICLE BEAM APPARATUS
37
Patent #:
NONE
Issue Dt:
Application #:
16487566
Filing Dt:
08/21/2019
Publication #:
US20190385810
Pub Dt:
12/19/2019
Title:
Charged Particle Beam Device
38
Patent #:
11624752
Issue Dt:
04/11/2023
Application #:
16488647
Filing Dt:
08/26/2019
Publication #:
US20200386779
Pub Dt:
12/10/2020
Title:
Automatic Analyzer
39
Patent #:
11415587
Issue Dt:
08/16/2022
Application #:
16493810
Filing Dt:
09/13/2019
Publication #:
US20200025781
Pub Dt:
01/23/2020
Title:
Sample Container Transfer Device
40
Patent #:
11262372
Issue Dt:
03/01/2022
Application #:
16493940
Filing Dt:
09/13/2019
Publication #:
US20210123935
Pub Dt:
04/29/2021
Title:
Automated Analysis System
41
Patent #:
10886101
Issue Dt:
01/05/2021
Application #:
16494595
Filing Dt:
09/16/2019
Publication #:
US20200090903
Pub Dt:
03/19/2020
Title:
Charged Particle Beam Device
42
Patent #:
10991543
Issue Dt:
04/27/2021
Application #:
16509694
Filing Dt:
07/12/2019
Publication #:
US20200035450
Pub Dt:
01/30/2020
Title:
Charged Particle Beam Device
43
Patent #:
11418101
Issue Dt:
08/16/2022
Application #:
16600010
Filing Dt:
10/11/2019
Publication #:
US20200126749
Pub Dt:
04/23/2020
Title:
Linear Motor for Vacuum and Vacuum Processing Apparatus
44
Patent #:
11404242
Issue Dt:
08/02/2022
Application #:
16604876
Filing Dt:
10/11/2019
Publication #:
US20200126754
Pub Dt:
04/23/2020
Title:
Charged Particle Beam Device and Method for Setting Condition in Charged Particle Beam Device
45
Patent #:
NONE
Issue Dt:
Application #:
16604908
Filing Dt:
10/11/2019
Publication #:
US20200056141
Pub Dt:
02/20/2020
Title:
Charged Particle Beam Apparatus and Cell Evaluation Method
46
Patent #:
11321585
Issue Dt:
05/03/2022
Application #:
16604918
Filing Dt:
10/11/2019
Publication #:
US20200125894
Pub Dt:
04/23/2020
Title:
Imaging Device and Morphological Feature Data Display Method
47
Patent #:
NONE
Issue Dt:
Application #:
16609248
Filing Dt:
10/29/2019
Publication #:
US20200047181
Pub Dt:
02/13/2020
Title:
Sample Processing Device
48
Patent #:
11107656
Issue Dt:
08/31/2021
Application #:
16616097
Filing Dt:
11/22/2019
Publication #:
US20200211815
Pub Dt:
07/02/2020
Title:
Charged Particle Beam Device
49
Patent #:
11458513
Issue Dt:
10/04/2022
Application #:
16616165
Filing Dt:
11/22/2019
Publication #:
US20200206789
Pub Dt:
07/02/2020
Title:
Charged Particle Beam Apparatus and Cleaning Method
50
Patent #:
11049706
Issue Dt:
06/29/2021
Application #:
16618198
Filing Dt:
11/29/2019
Publication #:
US20210159063
Pub Dt:
05/27/2021
Title:
Mass Spectrometer and Nozzle Member
51
Patent #:
11906406
Issue Dt:
02/20/2024
Application #:
16618630
Filing Dt:
12/02/2019
Publication #:
US20200182754
Pub Dt:
06/11/2020
Title:
Automatic Analyzer and Analysis Method
52
Patent #:
11067391
Issue Dt:
07/20/2021
Application #:
16618835
Filing Dt:
12/03/2019
Publication #:
US20200132448
Pub Dt:
04/30/2020
Title:
Charged Particle Beam Device and Sample Thickness Measurement Method
53
Patent #:
10964508
Issue Dt:
03/30/2021
Application #:
16620065
Filing Dt:
12/06/2019
Title:
CHARGED-PARTICLE BEAM DEVICE
54
Patent #:
11788971
Issue Dt:
10/17/2023
Application #:
16620697
Filing Dt:
12/09/2019
Publication #:
US20210140894
Pub Dt:
05/13/2021
Title:
Test Kit, Test Method, Dispensing Device
55
Patent #:
11243187
Issue Dt:
02/08/2022
Application #:
16620961
Filing Dt:
12/10/2019
Publication #:
US20200200705
Pub Dt:
06/25/2020
Title:
Electrophoretic Medium Container
56
Patent #:
11515121
Issue Dt:
11/29/2022
Application #:
16660152
Filing Dt:
10/22/2019
Title:
Electron Beam Device
57
Patent #:
11201033
Issue Dt:
12/14/2021
Application #:
16664100
Filing Dt:
10/25/2019
Publication #:
US20200185186
Pub Dt:
06/11/2020
Title:
Charged Particle Beam Device and Electrostatic Lens
58
Patent #:
10948347
Issue Dt:
03/16/2021
Application #:
16689802
Filing Dt:
11/20/2019
Publication #:
US20200088577
Pub Dt:
03/19/2020
Title:
Far-Infrared Spectroscopy Device
59
Patent #:
D907593
Issue Dt:
01/12/2021
Application #:
29611001
Filing Dt:
07/18/2017
Title:
Discharge Chamber for a Plasma Processing Apparatus
60
Patent #:
D882603
Issue Dt:
04/28/2020
Application #:
29627781
Filing Dt:
11/29/2017
Title:
Clinical Analyzer with Graphical User Interface
61
Patent #:
D924824
Issue Dt:
07/13/2021
Application #:
29677728
Filing Dt:
01/23/2019
Title:
Ion Shield Plate Base for Semiconductor Manufacturing Apparatus
62
Patent #:
D900760
Issue Dt:
11/03/2020
Application #:
29677753
Filing Dt:
01/23/2019
Title:
Ion Shield Plate for Semiconductor Manufacturing Apparatus
63
Patent #:
D901407
Issue Dt:
11/10/2020
Application #:
29677764
Filing Dt:
01/23/2019
Title:
Integrated Type Ion Shield for Semiconductor Manufacturing Apparatus
64
Patent #:
D891636
Issue Dt:
07/28/2020
Application #:
29688724
Filing Dt:
04/24/2019
Title:
Ring for a Plasma Processing Apparatus
65
Patent #:
D958215
Issue Dt:
07/19/2022
Application #:
29699268
Filing Dt:
07/24/2019
Title:
Electron Microscope
66
Patent #:
D916038
Issue Dt:
04/13/2021
Application #:
29706143
Filing Dt:
09/18/2019
Title:
GROUNDED ELECTRODE FOR A PLASMA PROCESSING APPARATUS
67
Patent #:
D909607
Issue Dt:
02/02/2021
Application #:
29713039
Filing Dt:
11/13/2019
Title:
Clinical Analyzer
68
Patent #:
D909608
Issue Dt:
02/02/2021
Application #:
29713044
Filing Dt:
11/13/2019
Title:
Clinical Analyzer
69
Patent #:
D909609
Issue Dt:
02/02/2021
Application #:
29713053
Filing Dt:
11/13/2019
Title:
Clinical Analyzer
70
Patent #:
D909610
Issue Dt:
02/02/2021
Application #:
29713060
Filing Dt:
11/13/2019
Title:
Sample Supply Unit
Assignor
1
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee
1
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondence name and address
CROWELL & MORING LLP
P.O. BOX 14300
WASHINGTON, DC 20044-4300

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