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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	031911/0254			Pages:	4
		Recorded:	01/02/2014
Conveyance:	CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).

Total properties: 32

Patent #:	6768983	Issue Dt:	07/27/2004	Application #:	09727530	Filing Dt:	11/28/2000
Title:	SYSTEM AND METHOD FOR REAL-TIME LIBRARY GENERATION OF GRATING PROFILES

Patent #:	6591405	Issue Dt:	07/08/2003	Application #:	09727531	Filing Dt:	11/28/2000
Title:	CLUSTERING FOR DATA COMPRESSION

Patent #:	6636843	Issue Dt:	10/21/2003	Application #:	09737705	Filing Dt:	12/14/2000
Publication #:	US20020188580	Pub Dt:	12/12/2002
Title:	SYSTEM AND METHOD FOR GRATING PROFILE CLASSIFICATION

Patent #:	6891626	Issue Dt:	05/10/2005	Application #:	09770997	Filing Dt:	01/25/2001
Publication #:	US20020033954	Pub Dt:	03/21/2002
Title:	CACHING OF INTRA-LAYER CALCULATIONS FOR RAPID RIGOROUS COUPLED-WAVE ANALYSES

Patent #:	6433878	Issue Dt:	08/13/2002	Application #:	09772148	Filing Dt:	01/29/2001
Publication #:	US20020131055	Pub Dt:	09/19/2002
Title:	METHOD AND APPARATUS FOR THE DETERMINATION OF MASK RULES USING SCATTEROMETRY

Patent #:	6699624	Issue Dt:	03/02/2004	Application #:	09794686	Filing Dt:	02/27/2001
Publication #:	US20020135875	Pub Dt:	09/26/2002
Title:	GRATING TEST PATTERNS AND METHODS FOR OVERLAY METROLOGY

Patent #:	6943900	Issue Dt:	09/13/2005	Application #:	09907488	Filing Dt:	07/16/2001
Publication #:	US20020035455	Pub Dt:	03/21/2002
Title:	GENERATION OF A LIBRARY OF PERIODIC GRATING DIFFRACTION SIGNALS

Patent #:	6785638	Issue Dt:	08/31/2004	Application #:	09923578	Filing Dt:	08/06/2001
Publication #:	US20030028358	Pub Dt:	02/06/2003
Title:	METHOD AND SYSTEM OF DYNAMIC LEARNING THROUGH A REGRESSION-BASED LIBRARY GENERATION PROCESS

Patent #:	6833914	Issue Dt:	12/21/2004	Application #:	10004495	Filing Dt:	10/23/2001
Title:	SYSTEM AND METHOD FOR EFFICIENT SIMULATION OF REFLECTOMETRY RESPONSE FROM TWO-DIMENSIONAL GRATING STRUCTURES

Patent #:	6608690	Issue Dt:	08/19/2003	Application #:	10007124	Filing Dt:	12/04/2001
Publication #:	US20030103218	Pub Dt:	06/05/2003
Title:	OPTICAL PROFILOMETRY OF ADDITIONAL-MATERIAL DEVIATIONS IN A PERIODIC GRATING

Patent #:	6608686	Issue Dt:	08/19/2003	Application #:	10022035	Filing Dt:	12/13/2001
Publication #:	US20030151751	Pub Dt:	08/14/2003
Title:	MEASUREMENT OF METAL ELECTROPLATING AND SEED LAYER THICKNESS AND PROFILE

Patent #:	6743646	Issue Dt:	06/01/2004	Application #:	10035925	Filing Dt:	10/22/2001
Publication #:	US20030194820	Pub Dt:	10/16/2003
Title:	BALANCING PLANARIZATION OF LAYERS AND THE EFFECT OF UNDERLYING STRUCTURE ON THE METROLOGY SIGNAL

Patent #:	7031894	Issue Dt:	04/18/2006	Application #:	10051830	Filing Dt:	01/16/2002
Publication #:	US20030200063	Pub Dt:	10/23/2003
Title:	GENERATING A LIBRARY OF SIMULATED-DIFFRACTION SIGNALS AND HYPOTHETICAL PROFILES OF PERIODIC GRATINGS

Patent #:	6772084	Issue Dt:	08/03/2004	Application #:	10066555	Filing Dt:	01/31/2002
Publication #:	US20030212525	Pub Dt:	11/13/2003
Title:	OVERLAY MEASUREMENTS USING PERIODIC GRATINGS

Patent #:	6609086	Issue Dt:	08/19/2003	Application #:	10075904	Filing Dt:	02/12/2002
Title:	PROFILE REFINEMENT FOR INTEGRATED CIRCUIT METROLOGY

Patent #:	7136796	Issue Dt:	11/14/2006	Application #:	10087069	Filing Dt:	02/28/2002
Publication #:	US20030163295	Pub Dt:	08/28/2003
Title:	GENERATION AND USE OF INTEGRATED CIRCUIT PROFILE-BASED SIMULATION INFORMATION

Patent #:	6721691	Issue Dt:	04/13/2004	Application #:	10108818	Filing Dt:	03/26/2002
Publication #:	US20030187602	Pub Dt:	10/02/2003
Title:	METROLOGY HARDWARE SPECIFICATION USING A HARDWARE SIMULATOR

Patent #:	6792328	Issue Dt:	09/14/2004	Application #:	10109955	Filing Dt:	03/29/2002
Publication #:	US20030187840	Pub Dt:	10/02/2003
Title:	METROLOGY DIFFRACTION SIGNAL ADAPTATION FOR TOOL-TO-TOOL MATCHING

Patent #:	6645824	Issue Dt:	11/11/2003	Application #:	10137200	Filing Dt:	04/30/2002
Publication #:	US20030203590	Pub Dt:	10/30/2003
Title:	COMBINED OPTICAL PROFILOMETRY AND PROJECTION MICROSCOPY OF INTEGRATED CIRCUIT STRUCTURES

Patent #:	6804005	Issue Dt:	10/12/2004	Application #:	10138903	Filing Dt:	05/02/2002
Publication #:	US20030206298	Pub Dt:	11/06/2003
Title:	OVERLAY MEASUREMENTS USING ZERO-ORDER CROSS POLARIZATION MEASUREMENTS

Patent #:	7216045	Issue Dt:	05/08/2007	Application #:	10162516	Filing Dt:	06/03/2002
Publication #:	US20030225535	Pub Dt:	12/04/2003
Title:	SELECTION OF WAVELENGTHS FOR INTEGRATED CIRCUIT OPTICAL METROLOGY

Patent #:	6775015	Issue Dt:	08/10/2004	Application #:	10175207	Filing Dt:	06/18/2002
Publication #:	US20030232454	Pub Dt:	12/18/2003
Title:	OPTICAL METROLOGY OF SINGLE FEATURES

Patent #:	6780550	Issue Dt:	08/24/2004	Application #:	10187258	Filing Dt:	06/28/2002
Publication #:	US20040002011	Pub Dt:	01/01/2004
Title:	SINGLE PASS LITHOGRAPHY OVERLAY TECHNIQUE

Patent #:	7330279	Issue Dt:	02/12/2008	Application #:	10206491	Filing Dt:	07/25/2002
Publication #:	US20040017574	Pub Dt:	01/29/2004
Title:	MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY

Patent #:	6853942	Issue Dt:	02/08/2005	Application #:	10213485	Filing Dt:	08/06/2002
Publication #:	US20030187604	Pub Dt:	10/02/2003
Title:	METROLOGY HARDWARE ADAPTATION WITH UNIVERSAL LIBRARY

Patent #:	6842261	Issue Dt:	01/11/2005	Application #:	10228692	Filing Dt:	08/26/2002
Publication #:	US20040039473	Pub Dt:	02/26/2004
Title:	INTEGRATED CIRCUIT PROFILE VALUE DETERMINATION

Patent #:	7092110	Issue Dt:	08/15/2006	Application #:	10397631	Filing Dt:	03/25/2003
Publication #:	US20040017575	Pub Dt:	01/29/2004
Title:	OPTIMIZED MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY

Patent #:	7580823	Issue Dt:	08/25/2009	Application #:	11595358	Filing Dt:	11/09/2006
Publication #:	US20070118349	Pub Dt:	05/24/2007
Title:	GENERATION AND USE OF INTEGRATED CIRCUIT PROFILE-BASED SIMULATION INFORMATION

Patent #:	7474993	Issue Dt:	01/06/2009	Application #:	11788735	Filing Dt:	04/20/2007
Publication #:	US20070198211	Pub Dt:	08/23/2007
Title:	SELECTION OF WAVELENGTHS FOR INTEGRATED CIRCUIT OPTICAL METROLOGY

Patent #:	7593119	Issue Dt:	09/22/2009	Application #:	11866408	Filing Dt:	10/02/2007
Publication #:	US20080249754	Pub Dt:	10/09/2008
Title:	GENERATION OF A LIBRARY OF PERIODIC GRATING DIFFRACTION SIGNALS

Patent #:	7505153	Issue Dt:	03/17/2009	Application #:	12030166	Filing Dt:	02/12/2008
Publication #:	US20080151269	Pub Dt:	06/26/2008
Title:	MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY

Patent #:	7586623	Issue Dt:	09/08/2009	Application #:	12127640	Filing Dt:	05/27/2008
Publication #:	US20080259357	Pub Dt:	10/23/2008
Title:	OPTICAL METROLOGY OF SINGLE FEATURES

Assignor

TIMBRE TECHNOLOGIES, INC.

Exec Dt:

03/19/2013

Assignee

TEL TIMBRE TECHNOLOGIES, INC.

3100 WEST WARREN AVE.

FREMONT, CALIFORNIA 94538

Correspondence name and address
	TOKYO ELECTRON U.S. HOLDINGS, INC.
	2400 GROVE BOULEVARD
	AUSTIN, TX 78741

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