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Reel/Frame:023934/0255   Pages: 2
Recorded: 02/12/2010
Attorney Dkt #:AT040012US
Conveyance: NUNC PRO TUNC ASSIGNMENT (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
04/13/2010
Application #:
10591552
Filing Dt:
08/13/2007
Publication #:
Pub Dt:
11/20/2008
Title:
METHOD OF AND DEVICE FOR DETERMINING AT LEAST ONE CHARACTERISTIC PARAMETER OF A RESONANT STRUCTURE
Assignor
1
Exec Dt:
02/09/2010
Assignee
1
GROENEWOUDSEWEG 1
EINDHOVEN, NETHERLANDS NL-5621 BA
Correspondence name and address
NXP SEMICONDUCTORS IP&L DEPT.
1109 MCKAY DRIVE
MS41
SAN JOSE, CA 95131

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