Patent Assignment Details
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Reel/Frame: | 015230/0290 | |
| Pages: | 3 |
| | Recorded: | 04/19/2004 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/27/2007
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Application #:
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10687828
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Filing Dt:
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10/20/2003
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Publication #:
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Pub Dt:
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08/05/2004
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Title:
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METHOD AND APPARATUS FOR DETERMINING DEFECT DETECTION SENSITIVITY DATA, CONTROL METHOD OF DEFECT DETECTION APPARATUS, AND METHOD AND APPARATUS FOR DETECTING DEFECT OF SEMICONDUCTOR DEVICES
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Assignee
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1-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO, JAPAN |
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Correspondence name and address
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FINNEGAN, HENDERSON, FARABOW, ETAL.
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ERNEST F. CHAPMAN
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1300 I STREET, N.W.
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WASHINGTON, D.C. 20005-3315
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