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Reel/Frame:066541/0302   Pages: 3
Recorded: 02/23/2024
Attorney Dkt #:231072US01
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
18585340
Filing Dt:
02/23/2024
Publication #:
Pub Dt:
08/28/2025
Title:
Methods To Improve Etch Uniformity Across A Semiconductor Substrate When Etching With A Hydrofluoric Acid (HF) And Nitric Acid (HNO3) Solution
Assignors
1
Exec Dt:
02/21/2024
2
Exec Dt:
02/21/2024
Assignee
1
AKASAKA BIZ TOWER
3-1 AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107-6325
Correspondence name and address
RICHARD D. EGAN
1101 S. CAPITAL OF TEXAS HIGHWAY
SUITE C200
AUSTIN, TX 78746

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