Patent Assignment Details
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Reel/Frame: | 012770/0304 | |
| Pages: | 4 |
| | Recorded: | 04/05/2002 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/28/2004
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Application #:
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10115972
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Filing Dt:
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04/05/2002
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Publication #:
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Pub Dt:
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10/10/2002
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Title:
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TEST CIRCUIT, SEMICONDUCTOR PRODUCT WAFER HAVING THE TEST CIRCUIT, AND METHOD OF MONITORING MANUFACTURING PROCESS USING THE TEST CIRCUIT
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Assignee
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1-3, NAKASE, MIHAMA-KU |
MAKUHARI TECHNO GARDEN B5 |
CHIBA 261-8501, JAPAN |
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Correspondence name and address
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OLIFF & BERRIDGE, PLC
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JAMES A. OLIFF
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P.O. BOX 19928
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ALEXANDRIA, V.A. 22320
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