Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 061913/0317 | |
| Pages: | 3 |
| | Recorded: | 11/29/2022 | | |
Attorney Dkt #: | 4448-0739PUS1 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
17994858
|
Filing Dt:
|
11/28/2022
|
Publication #:
|
|
Pub Dt:
|
03/21/2024
| | | | |
Title:
|
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE
|
|
Assignee
|
|
|
195, SEC. 4, CHUNG HSING RD., CHUTUNG |
HSINCHU, TAIWAN 310401 |
|
Correspondence name and address
|
|
BIRCH, STEWART, KOLASCH & BIRCH, LLP
|
|
8110 GATEHOUSE ROAD, SUITE 100 E
|
|
FALLS CHURCH, VA 22042
|
Search Results as of:
09/22/2024 09:01 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|