Patent Assignment Details
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Reel/Frame: | 004518/0322 | |
| Pages: | 1 |
| | Recorded: | 02/11/1986 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/29/1987
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Application #:
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06828188
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Filing Dt:
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02/11/1986
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Title:
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SEMICONDUCTOR INTEGRATED CIRCUIT HAVING A TEST CIRCUIT FOR TESTING AN INTERNAL CIRCUIT
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Assignee
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1015, KAMIKODANAKA, NAKAHARA-KU, KAWASAKI-SHI |
KANAGAWA 211, JAPAN |
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Correspondence name and address
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STAAS & HALSEY
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1825 K STREET, N. W., STE. 816
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WASHINGTON, DC 20006
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