Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 054918/0325 | |
| Pages: | 3 |
| | Recorded: | 01/14/2021 | | |
| Attorney Dkt #: | 1857.8630005/1857.8630006 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
2
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Patent #:
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Issue Dt:
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04/04/2023
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Application #:
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16719075
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Filing Dt:
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12/18/2019
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Publication #:
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Pub Dt:
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04/23/2020
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Title:
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Diffraction Based Overlay Metrology Tool and Method of Diffraction Based Overlay Metrology
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Patent #:
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Issue Dt:
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05/09/2023
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Application #:
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16719107
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Filing Dt:
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12/18/2019
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Publication #:
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Pub Dt:
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04/23/2020
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Title:
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Diffraction Based Overlay Metrology Tool and Method of Diffraction Based Overlay Metrology
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Assignee
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| DE RUN 6501 |
| VELDHOVEN, NETHERLANDS NL - 5504 DR |
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Correspondence name and address
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STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
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1100 NEW YORK AVENUE, N.W.
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WASHINGTON, DC 20005
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