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Patent Assignment Details
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Reel/Frame:014457/0372   Pages: 3
Recorded: 09/02/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
06/07/2005
Application #:
10449761
Filing Dt:
05/30/2003
Publication #:
Pub Dt:
12/25/2003
Title:
TEST STRUCTURE FOR THE MEASUREMENT OF CONTACT TO GATE DISTANCE IN NON-VOLATILE MEMORY DEVICES AND CORRESPONDING TEST METHOD
Assignors
1
Exec Dt:
07/25/2003
2
Exec Dt:
07/25/2003
3
Exec Dt:
07/25/2003
4
Exec Dt:
08/05/2003
5
Exec Dt:
07/25/2003
Assignee
1
VIA C. OLIVETTI, 2
20041 AGRATE BRIANZA (MI), ITALY
Correspondence name and address
ALLEN, DYER, DOPPELT, MILBRATH, ET AL
CHRISTOPHER F. REGAN, ESQ.
255 S. ORANGE AVENUE
P.O. BOX 3791
ORLANDO, FLORIDA 32802

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