Patent Assignment Details
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Reel/Frame: | 005941/0414 | |
| Pages: | 2 |
| | Recorded: | 12/13/1991 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/18/1997
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Application #:
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07796385
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Filing Dt:
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11/22/1991
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Title:
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METHOD FOR TESTING ELECTRICAL PROPERTIES OF SILICON SINGLE CRYSTAL
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Assignee
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4-2, MARUNOUCHI 1 CHOME, CHIYODA-KU |
TOKYO, JAPAN |
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Correspondence name and address
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TERESA J. BANTA
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TOWNSEND, SNIDER & BANTA
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1225 EYE STREET, N.W. - SUITE 500
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WASHINGTON, DC 20005
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