Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 013595/0431 | |
| Pages: | 2 |
| | Recorded: | 12/11/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
4
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Patent #:
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Issue Dt:
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02/17/2004
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Application #:
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10024762
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Filing Dt:
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12/20/2001
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Publication #:
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Pub Dt:
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06/27/2002
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Title:
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PARTICLE-OPTICAL INSPECTION DEVICE ESPECIALLY FOR SEMICONDUCTOR WAFERS
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Patent #:
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Issue Dt:
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11/11/2003
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Application #:
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10024777
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Filing Dt:
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12/20/2001
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Publication #:
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Pub Dt:
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09/12/2002
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Title:
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SEM PROVIDED WITH A SECONDARY ELECTRON DETECTOR HAVING A CENTRAL ELECTRODE
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10043389
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Filing Dt:
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10/26/2001
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Publication #:
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Pub Dt:
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08/15/2002
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Title:
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SEM provided with an adjustable final electrode in the electrostatic objective
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Patent #:
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Issue Dt:
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11/11/2003
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Application #:
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10123666
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Filing Dt:
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04/16/2002
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Publication #:
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Pub Dt:
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10/24/2002
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Title:
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METHOD OF X-RAY ANALYSIS IN A PARTICLE-OPTICAL APPARATUS
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Assignee
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| 7451 NW EVERGREEN PARKWAY |
| HILLSBORO, OREGON 97124-5830 |
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Correspondence name and address
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PHILIPS ELECTRONICS NORTH AMERICA CORP.
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ROBERT J. KRAUS
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580 WHITE PLAINS ROAD
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TARRYTOWN, NY 10591
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