Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 009548/0434 | |
| Pages: | 3 |
| | Recorded: | 10/26/1998 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
05/08/2001
|
Application #:
|
09140323
|
Filing Dt:
|
08/26/1998
|
Title:
|
METHOD OF TESTING ELECTRICAL CHARACTERISTICS OF MULTIPLE SEMICONDUCTOR INTEGRATED CIRCUITS SIMULTANEOUSLY
|
|
Assignee
|
|
|
1006, OAZA KADOMA, KADOMA-SHI, |
OSAKA, JAPAN |
|
Correspondence name and address
|
|
SIXBEY, FRIEDMAN, LEEDOM & FERGUSON
|
|
GERALD J. FERGERSON, JR.
|
|
2010 CORPORATE RIDGE
|
|
SUITE 600
|
|
MCLEAN, VIRGINIA 22102
|
Search Results as of:
06/06/2024 03:22 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|