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Patent Assignment Details

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Reel/Frame:	024953/0435			Pages:	13
		Recorded:	09/08/2010
Attorney Dkt #:	3025.300001
Conveyance:	MERGER (SEE DOCUMENT FOR DETAILS).

Total properties: 15

Patent #:	5157251	Issue Dt:	10/20/1992	Application #:	07668886	Filing Dt:	03/13/1991
Title:	SCANNING FORCE MICROSCOPE HAVING ALIGNING AND ADJUSTING MEANS

Patent #:	5345815	Issue Dt:	09/13/1994	Application #:	07954695	Filing Dt:	09/30/1992
Title:	ATOMIC FORCE MICROSCOPE HAVING CANTILEVER WITH PIEZORESISTIVE DEFLECTION SENSOR

Patent #:	5481908	Issue Dt:	01/09/1996	Application #:	08055236	Filing Dt:	04/28/1993
Title:	RESONANCE CONTACT SCANNING FORCE MICROSCOPE

Patent #:	5406832	Issue Dt:	04/18/1995	Application #:	08086592	Filing Dt:	07/02/1993
Title:	SYNCHRONOUS SAMPLING SCANNING FORCE MICROSCOPE

Patent #:	5441343	Issue Dt:	08/15/1995	Application #:	08127661	Filing Dt:	09/27/1993
Title:	THERMAL SENSING SCANNING PROBE MICROSCOPE AND METHOD FOR MEASUREMENT OF THERMAL PARAMETERS OF A SPECIMEN

Patent #:	5483822	Issue Dt:	01/16/1996	Application #:	08238546	Filing Dt:	05/05/1994
Title:	ATOMIC FORCE MICROSCOPE HAVING CANTILEVER WITH PIEZORESISTIVE DEFLECTION SENSOR

Patent #:	5455420	Issue Dt:	10/03/1995	Application #:	08273740	Filing Dt:	07/12/1994
Title:	SCANNING PROBE MICROSCOPE APPARATUS FOR USE IN A SCANNING ELECTRON MICROSCOPE

Patent #:	5469734	Issue Dt:	11/28/1995	Application #:	08357133	Filing Dt:	12/15/1994
Title:	SCANNING APPARATUS LINEARIZATION AND CALIBRATION SYSTEM

Patent #:	5507179	Issue Dt:	04/16/1996	Application #:	08360588	Filing Dt:	12/21/1994
Title:	SYNCHRONOUS SAMPLING SCANNING FORCE MICROSCOPE

Patent #:	5595942	Issue Dt:	01/21/1997	Application #:	08417485	Filing Dt:	04/05/1995
Title:	METHOD OF FABRICATING CANTILEVER FOR ATOMIC FORCE MICROSCOPE HAVING PIEZORESISTIVE DEFLECTION DETECTOR

Patent #:	5510615	Issue Dt:	04/23/1996	Application #:	08478479	Filing Dt:	06/07/1995
Title:	SCANNING PROBE MICROSCOPE APPARATUS FOR USE IN A SCANNING ELECTRON MICROSCOPE

Patent #:	5705814	Issue Dt:	01/06/1998	Application #:	08521584	Filing Dt:	08/30/1995
Title:	SCANNING PROBE MICROSCOPE HAVING AUTOMATIC PROBE EXCHANGE AND ALIGNMENT

Patent #:	5641897	Issue Dt:	06/24/1997	Application #:	08560827	Filing Dt:	11/20/1995
Title:	SCANNING APPARATUS LINEARIZATION AND CALIBRATION SYSTEM

Patent #:	5681987	Issue Dt:	10/28/1997	Application #:	08631555	Filing Dt:	04/12/1996
Title:	RESONANCE CONTACT SCANNING FORCE MICROSCOPE

Patent #:	5714756	Issue Dt:	02/03/1998	Application #:	08710239	Filing Dt:	09/13/1996
Title:	SCANNING PROBE MICROSCOPE HAVING A SINGLE VIEWING DEVICE FOR ON-AXIS AND OBLIQUE ANGLE VIEWS

Assignor

Exec Dt:

04/30/2006

Assignee

112 ROBIN HILL ROAD

SANTA BARBARA, CALIFORNIA 93117

Correspondence name and address
	BRAD PEDERSEN
	80 SOUTH 8TH STREET
	4800 IDS CENTER
	MINNEAPOLIS, MN 55402

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