Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 050945/0437 | |
| Pages: | 3 |
| | Recorded: | 11/06/2019 | | |
| Attorney Dkt #: | 08090.427 (L0107C) |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/02/2021
|
Application #:
|
16676216
|
Filing Dt:
|
11/06/2019
|
|
Publication #:
|
|
Pub Dt:
|
03/05/2020
| | | | |
|
Title:
|
METHOD OF EXAMINING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTEM THEREOF
|
|
|
Assignee
|
|
|
|
|
| 9 OPPENHEIMER STREET |
| PARK RABIN |
| REHOVOT, ISRAEL 76705 |
|
|
Correspondence name and address
|
| |
LOWENSTEIN SANDLER LLP / AMAT PATENT DOC
|
| |
ONE LOWENSTEIN DRIVE
|
| |
ROSELAND, NJ 07068
|
Search Results as of:
06/27/2024 02:15 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
