Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 012036/0452 | |
| Pages: | 9 |
| | Recorded: | 07/31/2001 | | |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT ASSIGNMENT DOCUMENT PREVIOUSLY RECORDED AT REEL 10871 FRAME 0492. |
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Total properties:
11
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Patent #:
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Issue Dt:
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12/16/1997
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Application #:
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07790871
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Filing Dt:
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11/12/1991
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Title:
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TWO-PHASE OPTICAL INSPECTION METHOD AND APPARATUS FOR DEFECT DETECTION
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Patent #:
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Issue Dt:
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04/08/1997
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Application #:
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07801761
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Filing Dt:
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11/27/1991
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Title:
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APPARATUS AND METHOD FOR INSPECTION OF A PATTERNED OBJECT BY COMPARISON THEREOF TO A REFERENCE
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Patent #:
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Issue Dt:
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12/17/1996
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Application #:
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07880100
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Filing Dt:
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04/21/1992
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Title:
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APPARATUS AND METHOD FOR INSPECION OF A PATTERNED OBJECT BY COMPARISM THEREOF TO A REFERENCE
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Patent #:
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Issue Dt:
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05/10/1994
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Application #:
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07909340
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Filing Dt:
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07/06/1992
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Title:
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METHOD AND APPARATUS FOR DETECTING SURFACE DEVIATIONS FROM A REFERENCE PLANE
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Patent #:
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Issue Dt:
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04/08/1997
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Application #:
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08097971
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Filing Dt:
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07/26/1993
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Title:
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APPARATUS & METHOD FOR COMPARING AND ALIGNING TWO DIGITAL REPRESENTATIONS OF AN IMAGE
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Patent #:
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Issue Dt:
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11/14/1995
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Application #:
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08262285
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Filing Dt:
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06/20/1994
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Title:
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ELECTRON DETECTOR WITH HIGH BACKSCATTERED ELECTRON ACCEPTANCE FOR PARTICLE BEAM APPARATUS
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Patent #:
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Issue Dt:
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07/01/1997
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Application #:
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08579125
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Filing Dt:
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12/27/1995
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Title:
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SYSTEM FOR HIGH RESOLUTION IMAGING AND MEASUREMENT OF TOPOGRAPHIC AND MATERIAL FEATURES ON A SPECIMEN
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Patent #:
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Issue Dt:
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08/19/1997
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Application #:
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08606363
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Filing Dt:
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02/23/1996
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Title:
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RELIABLE DEFECT DETECTION USING MULTIPLE PERSPECTIVE SCANNING ELECTRON MICROSCOPE IMAGES
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Patent #:
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Issue Dt:
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05/25/1999
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Application #:
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08701485
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Filing Dt:
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08/22/1996
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Title:
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APPARATUS AND METHOD FOR COMPARING AND ALIGNING TWO DIGITAL REPRESENTATIONS OF AN IMAGE
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Patent #:
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Issue Dt:
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08/25/1998
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Application #:
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08818312
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Filing Dt:
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03/14/1997
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Title:
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UNIVERSAL CHUCK FOR HOLDING PLATES OF VARIOUS SIZES
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Patent #:
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Issue Dt:
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04/06/1999
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Application #:
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08843453
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Filing Dt:
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04/16/1997
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Title:
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OPTICAL INSPECTION METHOD AND APPARATUS
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Assignee
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| P.O. BOX 450A |
| SANTA CLARA, CALIFORNIA 95052 |
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Correspondence name and address
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APPLIED MATERIALS, INC.
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ATTN: PATENT GROUP
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2881 SCOTT BLVD., M/S 2061
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SANTA CLARA, CA 95050
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