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Reel/Frame:019401/0455   Pages: 2
Recorded: 05/23/2007
Attorney Dkt #:TI-60104
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11805326
Filing Dt:
05/23/2007
Publication #:
Pub Dt:
11/27/2008
Title:
Probe test system and method for testing a semiconductor package
Assignor
1
Exec Dt:
05/23/2007
Assignee
1
P.O. BOX 655474, MS 3999
DALLAS, TEXAS 75265
Correspondence name and address
YINGSHENG TUNG, REG. NO. 52,305
TEXAS INSTRUMENTS INCORPORATED
P.O. BOX 655474, MS 3999
DALLAS, TX 75265

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