Patent Assignment Details
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Reel/Frame: | 018593/0463 | |
| Pages: | 3 |
| | Recorded: | 11/07/2006 | | |
Attorney Dkt #: | 509982009200 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/26/2008
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Application #:
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11594659
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Filing Dt:
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11/07/2006
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Publication #:
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Pub Dt:
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05/08/2008
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Title:
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CONSECUTIVE MEASUREMENT OF STRUCTURES FORMED ON A SEMICONDUCTOR WAFER USING AN ANGLE-RESOLVED SPECTROSCOPIC SCATTEROMETER
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Assignee
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TBS BROADCAST CENTER 3-6 AKASAKA 5-CHOME, MINATO-KU |
TOKYO, JAPAN 107 |
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Correspondence name and address
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PETER J. YIM
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MORRISON & FOERSTER LLP
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425 MARKET STREET
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SAN FRANCISCO, CA 94105
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