Patent Assignment Details
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Reel/Frame: | 016987/0468 | |
| Pages: | 15 |
| | Recorded: | 01/10/2006 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
2
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Patent #:
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Issue Dt:
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01/24/1995
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Application #:
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08063109
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Filing Dt:
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05/17/1993
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Title:
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DEPTH MEASUREMENT OF HIGH ASPECT RATIO STRUCTURES
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Patent #:
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Issue Dt:
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02/21/1995
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Application #:
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08125955
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Filing Dt:
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09/22/1993
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Title:
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METHOD FOR MEASURING A TRENCH DEPTH PARAMETER OF A MATERIAL
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Assignee
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GROENEWOUDSEWEG 1 |
EINDHOVEN, NETHERLANDS NL 5621 BA |
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Correspondence name and address
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PHILIPS ELECTRONICS NORTH AMERICA CORP.
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345 SCARBOROUGH ROAD
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BRIARCLIFF MANOR, NY 10510
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