Patent Assignment Details
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Reel/Frame: | 011308/0471 | |
| Pages: | 3 |
| | Recorded: | 11/08/2000 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/21/2003
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Application #:
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09709184
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Filing Dt:
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11/08/2000
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Title:
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METHOD FOR LOCATING DEFECTS AND MEASURING RESISTANCE IN A TEST STRUCTURE
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Assignee
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2100 LOGIC DRIVE |
SAN JOSE, CALIFORNIA 95124 |
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Correspondence name and address
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XILINX, INC.
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EDEL M. YOUNG
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2100 LOGIC DRIVE
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SAN JOSE, CA 95124
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