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Total properties:
27
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Patent #:
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Issue Dt:
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03/17/1981
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Application #:
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05956668
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Filing Dt:
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11/01/1978
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Title:
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PHOTOACOUSTIC MICROSCOPY
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Patent #:
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Issue Dt:
|
11/27/1984
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Application #:
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06381891
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Filing Dt:
|
05/25/1982
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Title:
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METHOD FOR EVALUATING THE QUALITY OF THE BOND BETWEEN TWO MEMBERS UTILIZING THERMOACOUSTIC MICROSCOPY
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Patent #:
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Issue Dt:
|
04/23/1985
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Application #:
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06389623
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Filing Dt:
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06/18/1982
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Title:
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THIN FILM THICKNESS MEASUREMENTS AND DEPTH PROFILING UTILIZING A THERMAL WAVE DETECTION SYSTEM
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Patent #:
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Issue Dt:
|
06/04/1985
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Application #:
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06401511
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Filing Dt:
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07/26/1982
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Title:
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METHOD FOR DETECTION OF THERMAL WAVES WITH A LASER PROBE
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Patent #:
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Issue Dt:
|
06/11/1985
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Application #:
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06481275
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Filing Dt:
|
04/01/1983
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Title:
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THIN FILM THICKNESS MEASUREMENT WITH THERMAL WAVES
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Patent #:
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Issue Dt:
|
04/01/1986
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Application #:
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06612075
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Filing Dt:
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05/21/1984
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Title:
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DETECTING THERMAL WAVES TO EVALUATE THERMAL PARAMETERS
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Patent #:
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Issue Dt:
|
01/13/1987
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Application #:
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06612076
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Filing Dt:
|
05/21/1984
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Title:
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METHOD AND APPARATUS FOR EVALUATING SURFACE CONDITIONS OF A SAMPLE
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|
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Patent #:
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Issue Dt:
|
07/14/1987
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Application #:
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06612077
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Filing Dt:
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05/21/1984
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Title:
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EVALUATING BOTH THICKNESS AND COMPOSITIONAL VARIABLES IN A THIN FILM SAMPLE
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|
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Patent #:
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|
Issue Dt:
|
12/30/1986
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Application #:
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06728759
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Filing Dt:
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04/30/1985
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Title:
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EVALUATION OF SURFACE AND SUBSURFACE CHARACTERISTICS OF A SAMPLE
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|
|
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Patent #:
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|
Issue Dt:
|
01/06/1987
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Application #:
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06797949
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Filing Dt:
|
11/14/1985
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|
Title:
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METHOD AND APPARATUS FOR DETECTING THERMAL WAVES
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|
|
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Patent #:
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Issue Dt:
|
06/14/1988
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Application #:
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06845606
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Filing Dt:
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03/28/1986
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Title:
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METHOD AND APPARATUS FOR OPTICALLY DETECTING SURFACE STATES IN MATERIALS
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Patent #:
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Issue Dt:
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01/03/1989
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Application #:
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07050911
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Filing Dt:
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05/15/1987
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Title:
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APPARATUS FOR LOCATING AND TESTING AREAS OF INTEREST ON A WORKPIECE
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Patent #:
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Issue Dt:
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08/08/1989
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Application #:
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07076876
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Filing Dt:
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07/23/1987
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Title:
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METHOD AND APPARATUS FOR EVALUATING SURFACE AND SUBSURFACE FEATURES IN A SEMICONDUCTOR
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|
|
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Patent #:
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Issue Dt:
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03/12/1991
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Application #:
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07347812
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Filing Dt:
|
05/04/1989
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Title:
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METHOD AND APPARATUS FOR MEASURING THICKNESS OF THIN FILMS
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|
|
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Patent #:
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|
Issue Dt:
|
08/28/1990
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Application #:
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07351540
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Filing Dt:
|
05/15/1989
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|
Title:
|
METHOD AND APPARATUS FOR EVALUATING SURFACE AND SUBSURFACE FEATURES IN A SEMICONDUCTOR
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|
|
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Patent #:
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Issue Dt:
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08/27/1991
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Application #:
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07409393
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Filing Dt:
|
09/19/1989
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Title:
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HIGH RESOLUTION ELLIPSOMETRIC APPARATUS
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|
|
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Patent #:
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|
Issue Dt:
|
12/24/1991
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Application #:
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07448882
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Filing Dt:
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12/12/1989
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Title:
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METHOD AND APPARATUS FOR EVALUATING ION IMPLANT DOSAGE LEVELS IN SEMICONDUCTORS
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Patent #:
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Issue Dt:
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08/27/1991
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Application #:
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07550333
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Filing Dt:
|
07/09/1990
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Title:
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METHOD AND APPARATUS FOR EVALUATING SURFACE AND SUBSURFACE AND SUBSURFACE FEATURES IN A SEMICONDUCTOR
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|
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Patent #:
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|
Issue Dt:
|
09/22/1992
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Application #:
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07624036
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Filing Dt:
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12/07/1990
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Title:
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APPARATUS FOR MEASURING GRAIN SIZES IN METALIZED LAYERS
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Patent #:
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Issue Dt:
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10/27/1992
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Application #:
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07670040
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Filing Dt:
|
03/15/1991
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Title:
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OPTICAL MEASUREMENT DEVICE WITH ENHANCED SENSITIVITY
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|
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Patent #:
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|
Issue Dt:
|
01/19/1993
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Application #:
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07813900
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Filing Dt:
|
12/23/1991
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|
Title:
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METHOD AND APPARATUS FOR EVALUATING THE THICKNESS OF THIN FILMS
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|
|
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Patent #:
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|
Issue Dt:
|
07/20/1993
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Application #:
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07879760
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Filing Dt:
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05/06/1992
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|
Title:
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APPARATUS FOR EVALUATING THERMAL AND ELECTRICAL CHARACTERISTICS IN A SAMPLE
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|
|
|
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Patent #:
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|
Issue Dt:
|
05/02/1995
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Application #:
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08093178
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Filing Dt:
|
07/16/1993
|
|
Title:
|
MULTIPLE ANGLE SPECTROSCOPIC ANALYZER UTILIZING INTERFEROMETRIC AND ELLIPSOMETRIC DEVICES
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|
|
|
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Patent #:
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|
Issue Dt:
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01/21/1997
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Application #:
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08532871
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Filing Dt:
|
08/15/1995
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|
Title:
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SAMPLE CHARACTERISTIC ANALYSIS UTILZING MULTI WAVELENGTH AND MULTI ANGLE POLARIZATION AND MAGNITUDE CHANGE DETECTION
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|
|
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Patent #:
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Issue Dt:
|
01/21/1997
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Application #:
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08614522
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Filing Dt:
|
03/18/1996
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|
Title:
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INTEGRATED SPECTROSCOPIC ELLIPSOMETER
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|
|
|
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Patent #:
|
|
Issue Dt:
|
01/26/1999
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Application #:
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08649576
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Filing Dt:
|
05/17/1996
|
|
Title:
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METHOD AND APPARATUS FOR OPTICAL DATA ANALYSIS
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|
|
|
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Patent #:
|
|
Issue Dt:
|
03/02/1999
|
Application #:
|
08685606
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Filing Dt:
|
07/24/1996
|
|
Title:
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BROADBEND SPECTROSCOPIC ROTATING COMPENSATOR ELLIPSOMETER
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