Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 020753/0479 | |
| Pages: | 12 |
| | Recorded: | 04/04/2008 | | |
Attorney Dkt #: | 037689-3 |
Conveyance: | LICENSE (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
2
|
|
Patent #:
|
|
Issue Dt:
|
07/03/1990
|
Application #:
|
07308253
|
Filing Dt:
|
02/09/1989
|
Title:
|
METHOD AND APPARATUS FOR MEASURING REGISTRATION BETWEEN LAYERS OF A SEMICONDUCTOR WAFER
|
|
|
Patent #:
|
|
Issue Dt:
|
09/02/2003
|
Application #:
|
09648262
|
Filing Dt:
|
08/25/2000
|
Title:
|
OVERLAY REGISTRATION ERROR MEASUREMENT MADE SIMULTANEOUSLY FOR MORE THAN TWO SEMICONDUCTOR WAFER LAYERS
|
|
Assignee
|
|
|
1550 BUCKEYE DRIVE |
MILPITAS, CALIFORNIA 95035 |
|
Correspondence name and address
|
|
HEATHER L. STEWART
|
|
THELEN REID BROWN RAYSMAN & STEINER LLP
|
|
P.O. BOX 190187
|
|
SAN FRANCISCO, CA 94119-0187
|
Search Results as of:
06/21/2024 08:37 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|