Patent Assignment Details
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Reel/Frame: | 020604/0487 | |
| Pages: | 7 |
| | Recorded: | 03/05/2008 | | |
Attorney Dkt #: | R2180.0379/P379 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/16/2010
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Application #:
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12042783
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Filing Dt:
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03/05/2008
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Publication #:
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Pub Dt:
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09/11/2008
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Title:
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SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND SCAN ENABLE SIGNAL TIME CONTROL CIRCUIT
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Assignee
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3-6, NAKAMAGOME 1-CHOME, OHTA-KU |
TOKYO, JAPAN 143-8555 |
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Correspondence name and address
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DICKSTEIN SHAPIRO LLP
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1825 EYE STREET NW
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WASHINGTON, DC 20006-5403
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