|
Total properties:
56
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/14/1994
|
Application #:
|
07848309
|
Filing Dt:
|
03/09/1992
|
|
Title:
|
INTERFEROMETRIC INTEGRATION TECHNIQUE AND APPARATUS TO CONFINE 2PI DISCONTINUITY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/20/1993
|
Application #:
|
07880083
|
Filing Dt:
|
05/06/1992
|
|
Title:
|
ROUGH SURFACE PROFILER AND METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/09/1993
|
Application #:
|
07929676
|
Filing Dt:
|
08/13/1992
|
|
Title:
|
SCANNING PROBE MICROSCOPE INCLUDING HEIGHT PLUS DEFLECTION METHOD AND APPARATUS TO ACHIEVE BOTH HIGH RESOLUTION AND HIGH SPEED SCANNING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/26/1994
|
Application #:
|
07947831
|
Filing Dt:
|
09/21/1992
|
|
Title:
|
POSITIONING DEVICE FOR SCANNING PROBE MICROSCOPES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/13/1994
|
Application #:
|
07954695
|
Filing Dt:
|
09/30/1992
|
|
Title:
|
ATOMIC FORCE MICROSCOPE HAVING CANTILEVER WITH PIEZORESISTIVE DEFLECTION SENSOR
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/03/1994
|
Application #:
|
07982871
|
Filing Dt:
|
11/30/1992
|
|
Title:
|
AN IMPROVED SCANNING PROBE MICROSCOPE USING STORED DATA FOR VERTICAL PROBE POSITIONING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/14/1995
|
Application #:
|
08131486
|
Filing Dt:
|
10/04/1993
|
|
Title:
|
METHOD FOR TESTING AN OPTICAL WINDOW WITH A SMALL WEDGE ANGLE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/11/1994
|
Application #:
|
08143372
|
Filing Dt:
|
10/25/1993
|
|
Title:
|
ROUGH SURFACE PROFILER AND METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/23/1995
|
Application #:
|
08202287
|
Filing Dt:
|
02/25/1994
|
|
Title:
|
SCANNING PROBE MICROSCOPE USING STORED DATA FOR VERTICAL PROBE POSITIONING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/19/1995
|
Application #:
|
08210671
|
Filing Dt:
|
03/18/1994
|
|
Title:
|
MULTIMODE-LASER INTERFEROMETRIC APPARATUS FOR ELIMINATING BACKGROUND INTERFERENCE FRINGES FROM THIN-PLATE MEASUREMENTS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/29/1995
|
Application #:
|
08235105
|
Filing Dt:
|
04/29/1994
|
|
Title:
|
COMBINATION OF MOTORIZED AND PIEZOELECTRIC TRANSLATION FOR LONG-RANGE VERTICAL SCANNING INTERFEROMETRY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/16/1996
|
Application #:
|
08238546
|
Filing Dt:
|
05/05/1994
|
|
Title:
|
ATOMIC FORCE MICROSCOPE HAVING CANTILEVER WITH PIEZORESISTIVE DEFLECTION SENSOR
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/28/1995
|
Application #:
|
08247065
|
Filing Dt:
|
05/20/1994
|
|
Title:
|
COMBINATION OF WHITE-LIGHT SCANNING AND PHASE-SHIFTING INTERFEROMETRY FOR SURFACE PROFILE MEASUREMENTS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/20/1997
|
Application #:
|
08325997
|
Filing Dt:
|
10/19/1994
|
|
Title:
|
SCANNING FORCE MICROSCOPE HAVING ALIGNING AND ADJUSTING MEANS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/10/1998
|
Application #:
|
08339405
|
Filing Dt:
|
11/14/1994
|
|
Title:
|
METHOD AND APPARATUS FOR RESTORING DIGITIZED VIDEO PICTURES GENERATED BY AN OPTICAL SURFACE-HEIGHT PROFILER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/03/1997
|
Application #:
|
08368547
|
Filing Dt:
|
01/04/1995
|
|
Title:
|
SUSPENSION ASSEMBLY STATIC ATTITUDE AND DISTANCE MEASURING INSTRUMENT
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/26/1996
|
Application #:
|
08387635
|
Filing Dt:
|
02/13/1995
|
|
Title:
|
METHOD AND APPARATUS FOR ABSOLUTE OPTICAL MEASUREMENT OF ENTIRE SURFACES OF FLATS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/21/1997
|
Application #:
|
08417485
|
Filing Dt:
|
04/05/1995
|
|
Title:
|
METHOD OF FABRICATING CANTILEVER FOR ATOMIC FORCE MICROSCOPE HAVING PIEZORESISTIVE DEFLECTION DETECTOR
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/27/1997
|
Application #:
|
08446019
|
Filing Dt:
|
05/19/1995
|
|
Title:
|
CENTROID APPROACH FOR ESTIMATING MODULATION PEAK IN BROAD-BANDWIDTH INTERFEROMETRY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/30/1997
|
Application #:
|
08448004
|
Filing Dt:
|
05/23/1995
|
|
Title:
|
LARGE STAGE SYSTEM FOR SCANNING PROBE MICROSCOPES AND OTHER INSTRUMENTS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/10/1996
|
Application #:
|
08449353
|
Filing Dt:
|
05/24/1995
|
|
Title:
|
METHOD FOR MEASURING THIN-FILM THICKNESS AND STEP HEIGHT ON THE SURFACE OF THIN-FILM/SUBSTRATE TEST SAMPLES BY PHASE-SHIFTING INTERFEROMETRY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/02/1997
|
Application #:
|
08542437
|
Filing Dt:
|
10/12/1995
|
|
Title:
|
HIGH RESOLUTION FIBER OPTIC PROBE FOR NEAR FIELD OPTICAL MICROSCOPY AND METHOD OF MAKING SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/11/1997
|
Application #:
|
08597796
|
Filing Dt:
|
02/07/1996
|
|
Title:
|
METHOD AND APPARATUS FOR CORRECTING SURFACE PROFILES DETERMINED BY PHASE-SHIFTING INTERFEROMETRY ACCORDING TO OPTICAL PARAMETERS OF TEST SURFACE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/18/1998
|
Application #:
|
08601600
|
Filing Dt:
|
02/14/1996
|
|
Title:
|
ALL-FIBER, HIGH-SENSITIVITY, NEAR-FIELD OPTICAL MICROSCOPY INSTRUMENT EMPLOYING GUIDED WAVE LIGHT COLLECTOR AND SPECIMEN SUPPORT
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/17/1997
|
Application #:
|
08613462
|
Filing Dt:
|
03/11/1996
|
|
Title:
|
ORTHOGONAL-SCANNING MICROSCOPE OBJECTIVE FOR VERTICAL-SCANNING AND PHASE-SHIFTING INTERFEROMETRY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/10/1998
|
Application #:
|
08697865
|
Filing Dt:
|
08/30/1996
|
|
Title:
|
VARIABLE-SPEED SCANNING FOR INTERFEROMETRIC MEASUREMENTS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/03/1998
|
Application #:
|
08710239
|
Filing Dt:
|
09/13/1996
|
|
Title:
|
SCANNING PROBE MICROSCOPE HAVING A SINGLE VIEWING DEVICE FOR ON-AXIS AND OBLIQUE ANGLE VIEWS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/16/1999
|
Application #:
|
08771428
|
Filing Dt:
|
12/20/1996
|
|
Title:
|
METHOD OF COMBINING MULTIPLE SETS OF OVERLAPPING SURFACE-PROFILE INTERFEROMETRIC DATA TO PRODUCE A CONTINUOUS COMPOSITE MAP
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/23/1999
|
Application #:
|
08777655
|
Filing Dt:
|
12/31/1996
|
|
Title:
|
ATOMIC FORCE MICROSCOPE FOR MEASURING PROPERTIES OF DIELECTRIC AND INSULATING LAYERS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/02/1999
|
Application #:
|
08814351
|
Filing Dt:
|
03/11/1997
|
|
Title:
|
METHOD AND APPARATUS FOR CORRECTING SHIFTS BETWEEN A REFERENCE FOCAL POINT AND A REFERENCE SURFACE AS A RESULT OF THERMAL EFFECTS IN AN INTERFEROMETRIC OPTICAL OBJECTIVE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
12/01/1998
|
Application #:
|
08866747
|
Filing Dt:
|
05/30/1997
|
|
Title:
|
INTERCHANGEABLE SAMPLE STAGE WITH INTEGRAL REFERENCE SURFACE FOR MAGNETIC-HEAD SUSPENSION MEASURING INSTRUMENT
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/30/1999
|
Application #:
|
08889675
|
Filing Dt:
|
07/08/1997
|
|
Title:
|
AUTOCOLLIMATOR WITH GRATING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/26/2002
|
Application #:
|
08948909
|
Filing Dt:
|
10/10/1997
|
|
Title:
|
SCAN CONTROL FOR SCANNING PROBE MICROSCOPES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/05/2001
|
Application #:
|
09034175
|
Filing Dt:
|
03/04/1998
|
|
Title:
|
FEEDBACK CONTROL FOR SCANNING TUNNEL MICROSCOPES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/11/2000
|
Application #:
|
09082320
|
Filing Dt:
|
05/21/1998
|
|
Title:
|
TAPPING ATOMIC FORCE MICROSCOPE WITH PHASE OR FREQUENCY DETECTION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/07/2000
|
Application #:
|
09119549
|
Filing Dt:
|
07/20/1998
|
|
Title:
|
SCANNING STYLUS ATOMIC FORCE MICROSCOPE WITH CANTILEVER TRACKING AND OPTICAL ACCESS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/28/2001
|
Application #:
|
09145352
|
Filing Dt:
|
09/01/1998
|
|
Title:
|
METHOD AND APPARATUS FOR DNA SEQUENCING USING A LOCAL SENSITIVE FORCE DETECTOR
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/06/2001
|
Application #:
|
09153365
|
Filing Dt:
|
09/15/1998
|
|
Title:
|
METHOD OF COMBINING MULTIPLE SETS OF OVERLAPPING SURFACE-PROFILE INTERFEROMETRIC DATA TO PRODUCE A CONTINUOUS COMPOSITE MAP
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/06/2002
|
Application #:
|
09189443
|
Filing Dt:
|
11/10/1998
|
|
Title:
|
METHOD AND APPARATUS FOR A LINE BASED, TWO-DIMENSIONAL CHARACTERIZATION OF A THREE-DIMENSIONAL SURFACE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/20/2001
|
Application #:
|
09258404
|
Filing Dt:
|
02/26/1999
|
|
Title:
|
WHEELCHAIR HAVING A SINGLE TUBE BEND
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/06/2001
|
Application #:
|
09260599
|
Filing Dt:
|
03/02/1999
|
|
Title:
|
HIGH PRECISION OPTICAL METROLOGY USING FREQUENCY DOMAIN INTERPOLATION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/04/2003
|
Application #:
|
09491000
|
Filing Dt:
|
01/25/2000
|
|
Title:
|
METHOD AND APPARATUS FOR ATOMIC FORCE MICROSCOPY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/08/2003
|
Application #:
|
09766555
|
Filing Dt:
|
01/19/2001
|
|
Publication #:
|
|
Pub Dt:
|
07/25/2002
| | | | |
|
Title:
|
BALANCED MOMENTUM PROBE HOLDER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/01/2005
|
Application #:
|
10614425
|
Filing Dt:
|
07/07/2003
|
|
Publication #:
|
|
Pub Dt:
|
04/15/2004
| | | | |
|
Title:
|
BALANCED MOMENTUM PROBE HOLDER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/06/2006
|
Application #:
|
10638963
|
Filing Dt:
|
08/11/2003
|
|
Publication #:
|
|
Pub Dt:
|
02/17/2005
| | | | |
|
Title:
|
SYSTEM FOR WIDE FREQUENCY DYNAMIC NANOMECHANICAL ANALYSIS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/21/2006
|
Application #:
|
10822352
|
Filing Dt:
|
04/12/2004
|
|
Publication #:
|
|
Pub Dt:
|
10/14/2004
| | | | |
|
Title:
|
FLEXURE ASSEMBLY FOR A SCANNER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/29/2006
|
Application #:
|
10844200
|
Filing Dt:
|
05/12/2004
|
|
Publication #:
|
|
Pub Dt:
|
11/17/2005
| | | | |
|
Title:
|
METHODS OF FABRICATING STRUCTURES FOR CHARACTERIZING TIP SHAPE OF SCANNING PROBE MICROSCOPE PROBES AND STRUCTURES FABRICATED THEREBY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/13/2008
|
Application #:
|
10873064
|
Filing Dt:
|
06/21/2004
|
|
Publication #:
|
|
Pub Dt:
|
12/22/2005
| | | | |
|
Title:
|
PROBES FOR USE IN SCANNING PROBE MICROSCOPES AND METHODS OF FABRICATING SUCH PROBES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/22/2007
|
Application #:
|
11068479
|
Filing Dt:
|
02/28/2005
|
|
Publication #:
|
|
Pub Dt:
|
03/02/2006
| | | | |
|
Title:
|
BALANCED MOMENTUM PROBE HOLDER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/10/2009
|
Application #:
|
11315556
|
Filing Dt:
|
12/22/2005
|
|
Publication #:
|
|
Pub Dt:
|
05/11/2006
| | | | |
|
Title:
|
FLEXURE ASSEMBLY FOR A SCANNER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/10/2008
|
Application #:
|
11334952
|
Filing Dt:
|
01/19/2006
|
|
Publication #:
|
|
Pub Dt:
|
08/17/2006
| | | | |
|
Title:
|
CAPACITANCE PROBE FOR THIN DIELECTRIC FILM CHARACTERIZATION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/08/2009
|
Application #:
|
11436386
|
Filing Dt:
|
05/18/2006
|
|
Publication #:
|
|
Pub Dt:
|
12/07/2006
| | | | |
|
Title:
|
SYSTEM FOR WIDE FREQUENCY DYNAMIC NANOMECHANICAL ANALYSIS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/01/2007
|
Application #:
|
11466908
|
Filing Dt:
|
08/24/2006
|
|
Publication #:
|
|
Pub Dt:
|
12/14/2006
| | | | |
|
Title:
|
METHODS OF FABRICATING STRUCTURES FOR CHARACTERIZING TIP SHAPE OF SCANNING PROBE MICROSCOPE PROBES AND STRUCTURES FABRICATED THEREBY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/07/2009
|
Application #:
|
11492740
|
Filing Dt:
|
07/25/2006
|
|
Publication #:
|
|
Pub Dt:
|
01/31/2008
| | | | |
|
Title:
|
CANTILEVER FREE-DECAY MEASUREMENT SYSTEM WITH COHERENT AVERAGING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/25/2009
|
Application #:
|
11645092
|
Filing Dt:
|
12/22/2006
|
|
Publication #:
|
|
Pub Dt:
|
06/26/2008
| | | | |
|
Title:
|
SYSTEMS AND METHODS FOR UTILIZING SCANNING PROBE SHAPE CHARACTERIZATION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/15/2011
|
Application #:
|
11831175
|
Filing Dt:
|
07/31/2007
|
|
Publication #:
|
|
Pub Dt:
|
02/05/2009
| | | | |
|
Title:
|
HIGH-BANDWIDTH ACTUATOR DRIVE FOR SCANNING PROBE MICROSCOPY
|
|
