Patent Assignment Details
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| Reel/Frame: | 037888/0511 | |
| Pages: | 3 |
| | Recorded: | 03/03/2016 | | |
| Attorney Dkt #: | T1516.10312US01 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/02/2020
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Application #:
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15058071
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Filing Dt:
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03/01/2016
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Publication #:
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Pub Dt:
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06/29/2017
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Title:
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PROBE CARD AND WAFER TESTING SYSTEM AND WAFER TESTING METHOD
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Assignee
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| NO.8, LI-HSIN RD.6 |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN 300 |
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Correspondence name and address
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R. BURNS ISRAELSEN
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MASCHOFF BRENNAN
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PARK CITY, UT 84098
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05/30/2024 07:58 PM
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