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Total properties:
62
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Patent #:
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Issue Dt:
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11/10/1987
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Application #:
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06798632
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Filing Dt:
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11/15/1985
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Title:
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Patent #:
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Issue Dt:
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04/21/1987
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Application #:
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06798736
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Filing Dt:
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11/15/1985
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Title:
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Patent #:
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Issue Dt:
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09/15/1987
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Application #:
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06893095
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Filing Dt:
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08/01/1986
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Title:
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Patent #:
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Issue Dt:
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11/07/1989
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07014998
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Filing Dt:
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02/17/1987
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Title:
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RESONANT MECHANICAL SYSTEM
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Patent #:
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Issue Dt:
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04/05/1988
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Application #:
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07052140
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Filing Dt:
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04/21/1987
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Title:
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HIGH SPEED PATTERN RECOGNIZER
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Patent #:
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Issue Dt:
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01/10/1989
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Application #:
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07052841
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Filing Dt:
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05/21/1987
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Title:
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METHOD AND SYSTEM FOR HIGH-SPEED, 3-D IMAGING OF AN OBJECT AT A VISION STATION
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Patent #:
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Issue Dt:
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10/03/1989
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Application #:
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07128329
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Filing Dt:
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12/03/1987
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Title:
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SEMICONDUCTOR DEVICE INSPECTION SYSTEM
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Patent #:
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Issue Dt:
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06/18/1991
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07150135
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Filing Dt:
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01/29/1988
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Title:
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METHOD AND SYSTEM FOR HIGH-SPEED, HIGH-RESOLUTION, 3-D IMAGING OF AN OBJECT AT A VISION STATION
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Patent #:
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Issue Dt:
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04/24/1990
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Application #:
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07185150
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Filing Dt:
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04/22/1988
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Title:
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Z-AXIS MEASUREMENT SYSTEM
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Patent #:
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Issue Dt:
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04/24/1990
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Application #:
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07242789
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Filing Dt:
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09/09/1988
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Title:
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Patent #:
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Issue Dt:
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02/05/1991
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07303941
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01/30/1989
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Title:
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ASYMMETRICAL RESONANT SCANNER AND DEVICE
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Patent #:
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Issue Dt:
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05/22/1990
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Application #:
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07355816
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Filing Dt:
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05/19/1989
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Title:
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METHOD AND SYSTEM FOR AUTOMATICALLY VISUALLY INSPECTING AN ARTICLE
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Patent #:
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Issue Dt:
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06/09/1992
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07527131
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Filing Dt:
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05/22/1990
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Title:
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RESONANT SCANNER CONTROL SYSTEM
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Patent #:
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Issue Dt:
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03/17/1992
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07531928
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06/01/1990
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Title:
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Patent #:
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Issue Dt:
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07/06/1993
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07660705
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02/25/1991
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Title:
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Patent #:
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Issue Dt:
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06/16/1992
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07741087
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08/06/1991
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Title:
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Patent #:
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Issue Dt:
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04/05/1994
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07780763
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Filing Dt:
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10/22/1991
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Title:
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Patent #:
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Issue Dt:
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08/10/1993
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07847774
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Filing Dt:
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03/05/1992
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Title:
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Patent #:
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Issue Dt:
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07/06/1993
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07911192
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07/09/1992
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Title:
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Patent #:
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06/13/1995
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07964782
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10/22/1992
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Title:
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Patent #:
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07/16/1996
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08069145
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05/28/1993
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Patent #:
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02/08/2000
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08079504
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06/17/1993
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Title:
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METHOD AND SYSTEM FOR HIGH-SPEED, HIGH-RESOLUTION, 3-D IMAGING OF AN OBJECT AT A VISION STATION
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Patent #:
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Issue Dt:
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03/21/1995
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08135270
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10/12/1993
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Title:
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07/29/1997
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08138776
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10/19/1993
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Patent #:
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Issue Dt:
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11/19/1996
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08174150
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12/28/1993
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Title:
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Patent #:
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Issue Dt:
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08/13/1996
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08245864
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05/19/1994
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Title:
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TRIANGULATION-BASED 3D IMAGING AND PROCESSING METHOD AND SYSTEM
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Patent #:
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Issue Dt:
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06/18/1996
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Application #:
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08260093
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Filing Dt:
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06/15/1994
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Title:
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RESONANT SCANNER
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Patent #:
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Issue Dt:
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04/01/1997
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08429543
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04/27/1995
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Title:
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Patent #:
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05/28/1996
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08500777
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07/11/1995
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Title:
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RESONANT OPTICAL SCANNER
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Patent #:
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10/13/1998
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11/02/1995
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02/22/2000
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08594696
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01/31/1996
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08/05/1997
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07/29/1996
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TRIANGULATION-BASED 3D IMAGING AND PROCESSING METHOD AND SYSTEM
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12/07/1999
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08774107
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12/24/1996
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09/29/1998
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08825108
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03/27/1997
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09/07/1999
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08841289
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04/29/1997
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06/16/1998
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08848106
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04/28/1997
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SCANNED REMOTE IMAGING METHOD AND SYSTEM AND METHOD OF DETERMINING OPTIMUM DESIGN CHARACTERISTICS OF A FILTER FOR USE THEREIN
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12/14/1999
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08850208
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05/02/1997
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MULTI-COLOR LASER PROJECTOR FOR OPTICAL LAYUP TEMPLATE AND THE LIKE
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09/22/1998
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05/05/1997
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GRID ARRAY INSPECTION SYSTEM AND METHOD
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09/22/1998
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08853305
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05/09/1997
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TRIANGULATION-BASED 3-D IMAGING AND PROCESSING METHOD AND SYSTEM
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04/02/2002
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09035564
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03/05/1998
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METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS
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08/01/2000
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09035580
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03/05/1998
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VERSATILE METHOD AND SYSTEM FOR HIGH SPEED, 3D IMAGING OF MICROSCOPIC TARGETS
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01/15/2002
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06/12/1998
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01/30/2001
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07/02/1998
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CONTROLLING LASER POLARIZATION
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11/07/2000
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09/18/1998
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06/05/2001
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11/16/1998
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10/09/2001
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12/16/1998
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01/30/2001
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10/18/1999
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01/23/2001
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10/20/1999
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06/19/2001
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10/19/1999
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METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS
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01/08/2002
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11/16/1999
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11/19/2002
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05/16/2000
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06/01/2004
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09613833
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07/11/2000
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HIGH-SPEED PRECISION POSITIONING APPARATUS
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12/14/2004
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08/07/2000
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04/30/2002
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01/29/2001
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08/02/2001
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12/09/2003
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05/16/2001
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01/10/2002
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12/17/2002
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05/16/2001
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12/20/2001
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06/03/2003
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11/02/2001
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09/12/2002
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09/14/2004
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01/07/2002
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07/18/2002
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03/09/2004
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01/22/2002
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09/12/2002
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09/17/2002
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04/02/2002
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08/08/2002
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06/15/2004
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09/16/2002
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10/02/2003
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METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS
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11/18/2002
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06/26/2003
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