Patent Assignment Details
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| Reel/Frame: | 013258/0548 | |
| Pages: | 39 |
| | Recorded: | 09/09/2002 | | |
| Conveyance: | SEPARATION AGREEMENT |
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Total properties:
2
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Patent #:
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Issue Dt:
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08/07/2001
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Application #:
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08950000
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Filing Dt:
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10/14/1997
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Title:
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ELECTRICAL DIAGNOSTIC TECHNIQUE FOR SILICON PLASMA- ETCH INDUCED DAMAGE CHARACTERIZATION
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Patent #:
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Issue Dt:
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07/24/2001
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Application #:
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09277338
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Filing Dt:
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03/26/1999
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Title:
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METHOD FOR DETECTING AND CHARACTERIZING PLASMA-ETCH INDUCED DAMAGE IN AN INTEGRATED CIRCUIT
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Assignee
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| 2300 BUCKSKIN ROAD |
| POCATELLO, IDAHO 83201 |
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Correspondence name and address
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MARK KUSNER CO., LPA
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MARK KUSNER
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HIGHLAND PLACE, SUITE 310
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6151 WILSON MILLS ROAD
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HIGHLAND HEIGHTS, OHIO 44143
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