Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 034229/0577 | |
| Pages: | 6 |
| | Recorded: | 11/21/2014 | | |
Attorney Dkt #: | FIS920140242US1 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
12/13/2016
|
Application #:
|
14549719
|
Filing Dt:
|
11/21/2014
|
Publication #:
|
|
Pub Dt:
|
05/26/2016
| | | | |
Title:
|
VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN CHIP PROCESS VARIATION CHARACTERIZATION
|
|
Assignee
|
|
|
NEW ORCHARD ROAD |
ARMONK, NEW YORK 10504 |
|
Correspondence name and address
|
|
SCHMEISER, OLSEN & WATTS
|
|
22 CENTURY HILL DRIVE, SUITE 302
|
|
LATHAM, NY 12110
|
Search Results as of:
06/10/2024 05:31 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|