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Patent Assignment Details
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Reel/Frame:012845/0590   Pages: 11
Recorded: 04/22/2002
Conveyance: MERGER (SEE DOCUMENT FOR DETAILS).
Total properties: 4
1
Patent #:
Issue Dt:
08/04/1998
Application #:
08963510
Filing Dt:
11/03/1997
Title:
REALISTIC WORST-CASE CIRCUIT SIMULATION SYSTEM AND METHOD
2
Patent #:
Issue Dt:
10/09/2001
Application #:
09246469
Filing Dt:
02/09/1999
Title:
SYSTEM, IC CHIP, ON-CHIP TEST STRUCTURE, AND CORRESPONDING METHOD FOR MODELING ONE OR MORE TARGET INTERCONNECT CAPACITANCES
3
Patent #:
Issue Dt:
07/02/2002
Application #:
09757066
Filing Dt:
01/08/2001
Publication #:
Pub Dt:
05/10/2001
Title:
SYSTEM, IC CHIP, ON-CHIP TEST STRUCTURE, AND CORRESPONDING METHOD FOR MODELING ONE OR MORE TARGET INTERCONNECT CAPACITANCES
4
Patent #:
Issue Dt:
10/16/2001
Application #:
09757067
Filing Dt:
01/08/2001
Title:
System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances
Assignor
1
Exec Dt:
12/29/2000
Assignee
1
1982A ZANKER ROAD
SAN JOSE, CALIFORNIA 95112
Correspondence name and address
FLEHR HOHBACH TEST
ALDO J. TEST
FOUR EMBARCADERO CENTER
SUITE 3400
SAN FRANCISCO, CA 94111-4187

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