skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:068615/0620   Pages: 6
Recorded: 09/17/2024
Attorney Dkt #:14261.0365-00000
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
18708929
Filing Dt:
05/09/2024
Publication #:
Pub Dt:
01/02/2025
Title:
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING FOR CHARGED-PARTICLE INSPECTION APPARATUS
Assignors
1
Exec Dt:
06/03/2022
2
Exec Dt:
06/07/2022
3
Exec Dt:
06/13/2022
4
Exec Dt:
09/01/2022
5
Exec Dt:
09/01/2022
6
Exec Dt:
08/30/2022
7
Exec Dt:
09/09/2022
8
Exec Dt:
08/30/2022
Assignee
1
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondence name and address
YASUKO NAKAGAMI-SHER
FINNEGAN LLP
901 NEW YORK AVENUE, NW
WASHINGTON, DC 20001

Search Results as of: 06/26/2025 06:09 PM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT