Total properties:
13
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Patent #:
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Issue Dt:
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08/25/1981
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Application #:
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06073965
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Filing Dt:
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09/10/1979
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Title:
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APPARATUS FOR NEAR INFRARED QUANTITATIVE ANALYSIS
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Patent #:
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Issue Dt:
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09/13/1983
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Application #:
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06263881
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Filing Dt:
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05/15/1981
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Title:
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APPARATUS FOR NEAR INFRARED QUANTITATIVE ANALYSIS WITH TEMPERATURE VARIATION CORRECTION
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Patent #:
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Issue Dt:
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04/05/1983
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Application #:
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06337525
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Filing Dt:
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01/07/1982
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Title:
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UNIVERSAL CHAIN LINK COUNTING APPARATUS AND METHOD
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Patent #:
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Issue Dt:
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08/14/1984
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Application #:
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06355325
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Filing Dt:
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03/08/1982
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Title:
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APPARATUS FOR NEAR INFRARED QUANTITATIVE ANALYSIS WITH TEMPERATURE VARIATION CORRECTION
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Patent #:
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Issue Dt:
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12/02/1986
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Application #:
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06603821
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Filing Dt:
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04/25/1984
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Title:
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OPTICAL QUANTITATIVE ANALYSIS USING CURVILINEAR INTERPOLATION
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Patent #:
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Issue Dt:
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12/30/1986
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Application #:
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06726658
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Filing Dt:
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04/24/1985
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Title:
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NEAR INFRARED APPARATUS FOR MEASUREMENT OF ORGANIC CONSTITUENTS OF MATERIALS
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Patent #:
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Issue Dt:
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09/08/1987
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Application #:
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06739679
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Filing Dt:
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05/31/1985
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Title:
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NEAR INFRARED MEASURING INSTRUMENT WITH SAMPLE HOLDER
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Patent #:
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Issue Dt:
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03/29/1988
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Application #:
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06907889
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Filing Dt:
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09/16/1986
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Title:
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QUANTITATIVE NEAR-INFRARED MEASUREMENT INSTRUMENT FOR MULTIPLE MEASUREMENTS IN BOTH REFLECTANCE AND TRANSMISSION MODES
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Patent #:
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Issue Dt:
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08/02/1988
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Application #:
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06907890
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Filing Dt:
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09/16/1986
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Title:
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STANDARD FOR NEAR-INFRARED REFLECTANCE MEASUREMENT AND METHOD OF MAKING THE SAME
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Patent #:
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Issue Dt:
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01/31/1989
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Application #:
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06913468
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Filing Dt:
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09/30/1986
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Title:
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METHOD AND APPARATUS FOR NEAR INFRARED REFLECTANCE MEASUREMENT OF NON-HOMOGENEOUS MATERIALS
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Patent #:
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Issue Dt:
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04/10/1990
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Application #:
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07195796
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Filing Dt:
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05/19/1988
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Title:
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METHOD AND APPARATUS FOR OPTICAL SORTING OF MATERIALS USING NEAR INFRARED ABSORBTION CRITERIA
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Patent #:
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Issue Dt:
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11/13/1990
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Application #:
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07286740
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Filing Dt:
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12/20/1988
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Title:
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BIAS DRIFT COMPENSATION IN NEAR INFRARED QUANTITATIVE ANALYSIS INSTRUMENTS
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Patent #:
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Issue Dt:
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06/07/1994
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Application #:
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07890163
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Filing Dt:
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05/29/1992
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Title:
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RAPID NEAR-INFRARED MEASUREMENT OF NONHOMOGENEOUS SAMPLES
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