Patent Assignment Details
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| Reel/Frame: | 043641/0655 | |
| Pages: | 4 |
| | Recorded: | 09/20/2017 | | |
| Attorney Dkt #: | KASN 7211 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
10
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Patent #:
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Issue Dt:
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04/11/2000
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Application #:
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09030415
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Filing Dt:
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02/25/1998
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Title:
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FAILURE-DATA STORAGE SYSTEM
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Patent #:
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Issue Dt:
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01/30/2001
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Application #:
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09157016
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Filing Dt:
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09/18/1998
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Title:
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IC TESTER
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Patent #:
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Issue Dt:
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06/25/2002
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Application #:
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09362975
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Filing Dt:
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07/28/1999
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Title:
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PATTERN DATA TRANSFER CIRCUIT
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Patent #:
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Issue Dt:
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06/19/2001
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Application #:
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09400273
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Filing Dt:
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09/21/1999
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Title:
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TEMPERATURE STABILIZING CIRCUIT
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Patent #:
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Issue Dt:
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11/06/2001
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Application #:
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09592042
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Filing Dt:
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06/12/2000
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Title:
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Cooling system of a printed board
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Patent #:
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Issue Dt:
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04/30/2002
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Application #:
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09740012
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Filing Dt:
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12/20/2000
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Publication #:
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Pub Dt:
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09/13/2001
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Title:
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CIRCUIT, APPARATUS AND METHOD FOR GENERATING ADDRESS
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Patent #:
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Issue Dt:
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02/07/2006
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Application #:
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09816338
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Filing Dt:
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03/26/2001
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Publication #:
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Pub Dt:
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10/04/2001
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Title:
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SEQUENCE CONTROL CIRCUIT
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Patent #:
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Issue Dt:
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03/16/2004
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Application #:
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09818785
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Filing Dt:
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03/28/2001
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Publication #:
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Pub Dt:
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10/04/2001
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Title:
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CIRCUIT AND METHOD, FOR STORING DATA PRIOR TO AND AFTER DETERMINING FAILURE
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Patent #:
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Issue Dt:
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06/15/2010
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Application #:
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11751311
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Filing Dt:
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05/21/2007
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Publication #:
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Pub Dt:
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12/27/2007
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Title:
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POWER SUPPLY ASSEMBLY AND SEMICONDUCTOR TESTING SYSTEM USING SAME
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Patent #:
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Issue Dt:
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01/05/2010
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Application #:
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11819025
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Filing Dt:
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06/25/2007
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Publication #:
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Pub Dt:
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12/27/2007
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Title:
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SEMICONDUCTOR MEMORY TESTER
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Assignee
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| B-7F,28, PANGYO-RO 255 BEON-GIL |
| BUNDANG-GU |
| SEONGNAM-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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Correspondence name and address
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BRIAN S. MYERS
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100 HEADQUARTERS PLAZA
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NORTH TOWER 6TH FLOOR
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MORRISTOWN, NJ 07960-6834
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