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Reel/Frame:010812/0676   Pages: 4
Recorded: 05/09/2000
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
03/04/2003
Application #:
09567808
Filing Dt:
05/09/2000
Title:
IC TESTING APPARATUS AND IC TESTING METHOD
Assignor
1
Exec Dt:
04/28/2000
Assignee
1
OTA-KU
19-7, KAMATA 4-CHOME
TOKYO, JAPAN
Correspondence name and address
FISH & RICHARDSON P.C
SAMUEL BORODACH
45 ROCKEFELLER PLAZA, SUITE 2800
NEW YORK, NY 10111

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