Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 031777/0683 | |
| Pages: | 3 |
| | Recorded: | 12/13/2013 | | |
| Attorney Dkt #: | 14552-5 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/21/2017
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Application #:
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14126010
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Filing Dt:
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03/11/2014
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Publication #:
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Pub Dt:
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07/10/2014
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Title:
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METHOD AND APPARATUS FOR MEASURING TEMPERATURE OF SEMICONDUCTOR LAYER
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Assignee
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| TOKUSHIMA SCIENCE CENTER |
| 209-5, HIRAISHI-SUMIYOSHI, KAWAUCHI-CHO |
| TOKUSHIMA-SHI, JAPAN 7710134 |
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Correspondence name and address
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BRINKS GILSON & LIONE
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P.O. BOX 10395
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CHICAGO, IL 60610
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06/27/2024 04:20 PM
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