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Total properties:
21
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Patent #:
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|
Issue Dt:
|
11/09/2004
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Application #:
|
10445099
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Filing Dt:
|
05/23/2003
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Publication #:
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Pub Dt:
|
01/08/2004
| | | | |
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Title:
|
PROBE FOR TESTING A DEVICE UNDER TEST
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|
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Patent #:
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|
Issue Dt:
|
05/29/2007
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Application #:
|
10552391
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Filing Dt:
|
10/07/2005
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Publication #:
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Pub Dt:
|
08/24/2006
| | | | |
|
Title:
|
SYSTEM FOR REPLACEMENT OF SHEET ABRASIVE
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Patent #:
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NONE
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Issue Dt:
|
|
Application #:
|
11263592
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Filing Dt:
|
10/31/2005
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Publication #:
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|
Pub Dt:
|
05/04/2006
| | | | |
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Title:
|
Optically enhanced digital imaging system
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Patent #:
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Issue Dt:
|
05/19/2009
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Application #:
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11335037
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Filing Dt:
|
01/18/2006
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Publication #:
|
|
Pub Dt:
|
08/03/2006
| | | | |
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Title:
|
INTERFACE FOR TESTING SEMICONDUCTORS
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|
|
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Patent #:
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|
Issue Dt:
|
12/04/2007
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Application #:
|
11607398
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Filing Dt:
|
12/01/2006
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Publication #:
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Pub Dt:
|
04/05/2007
| | | | |
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Title:
|
SHIELDED PROBE FOR HIGH-FREQUENCY TESTING OF A DEVICE UNDER TEST
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|
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Patent #:
|
|
Issue Dt:
|
04/14/2009
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Application #:
|
11906055
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Filing Dt:
|
09/27/2007
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|
Publication #:
|
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Pub Dt:
|
01/31/2008
| | | | |
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Title:
|
SHIELDED PROBE FOR TESTING A DEVICE UNDER TEST
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/14/2008
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Application #:
|
11977324
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Filing Dt:
|
10/24/2007
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Publication #:
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Pub Dt:
|
02/28/2008
| | | | |
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Title:
|
SHIELDED PROBE WITH LOW CONTACT RESISTANCE FOR TESTING A DEVICE UNDER TEST
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|
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
09/06/2016
|
Application #:
|
13634009
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Filing Dt:
|
09/11/2012
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|
Publication #:
|
|
Pub Dt:
|
01/10/2013
| | |
PCT #:
|
US2011028373
|
|
Title:
|
FOCUSING OPTICAL SYSTEMS AND METHODS FOR TESTING SEMICONDUCTORS
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|
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
11/29/2016
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Application #:
|
13702054
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Filing Dt:
|
12/04/2012
|
|
Publication #:
|
|
Pub Dt:
|
03/28/2013
| | |
PCT #:
|
US2011031981
|
|
Title:
|
HIGH VOLTAGE CHUCK FOR A PROBE STATION
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|
|
|
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Patent #:
|
|
Issue Dt:
|
05/25/2021
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Application #:
|
16421173
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Filing Dt:
|
05/23/2019
|
|
Publication #:
|
|
Pub Dt:
|
12/05/2019
| | | | |
|
Title:
|
METHODS OF CONTROLLING THE OPERATION OF PROBE STATIONS AND PROBE STATIONS THAT PERFORM THE METHODS, THE METHODS INCLUDING GENERATING AND EXECUTING A TEST ROUTINE THAT DIRECTS THE PROBE STATION TO ELECTRICALLY TEST A TEST SUBSET OF A PLURALITY OF DUTS AND TO PRE-TEST A PRE-TEST SUBSET OF A PLURALITY OF DUTS, WHICH IS A SUBSET OF THE TEST SUBSET, WITH A PRE-TEST
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/23/2021
|
Application #:
|
16421243
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Filing Dt:
|
05/23/2019
|
|
Publication #:
|
|
Pub Dt:
|
09/12/2019
| | | | |
|
Title:
|
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/29/2021
|
Application #:
|
16600142
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Filing Dt:
|
10/11/2019
|
|
Publication #:
|
|
Pub Dt:
|
02/06/2020
| | | | |
|
Title:
|
PROBE SYSTEMS AND METHODS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/27/2022
|
Application #:
|
16752324
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Filing Dt:
|
01/24/2020
|
|
Publication #:
|
|
Pub Dt:
|
07/30/2020
| | | | |
|
Title:
|
MICROSCOPES WITH OBJECTIVE ASSEMBLY CRASH DETECTION AND METHODS OF UTILIZING THE SAME
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|
|
|
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Patent #:
|
|
Issue Dt:
|
06/29/2021
|
Application #:
|
16884921
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Filing Dt:
|
05/27/2020
|
|
Publication #:
|
|
Pub Dt:
|
12/03/2020
| | | | |
|
Title:
|
CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS INCLUDING THE CALIBRATION CHUCKS, AND METHODS OF UTILIZING THE OPTICAL PROBE SYSTEMS
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|
|
|
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Patent #:
|
|
Issue Dt:
|
12/21/2021
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Application #:
|
16914913
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Filing Dt:
|
06/29/2020
|
|
Publication #:
|
|
Pub Dt:
|
04/01/2021
| | | | |
|
Title:
|
METHODS FOR MAINTAINING GAP SPACING BETWEEN AN OPTICAL PROBE OF A PROBE SYSTEM AND AN OPTICAL DEVICE OF A DEVICE UNDER TEST, AND PROBE SYSTEMS THAT PERFORM THE METHODS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/28/2021
|
Application #:
|
17021288
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Filing Dt:
|
09/15/2020
|
|
Publication #:
|
|
Pub Dt:
|
04/01/2021
| | | | |
|
Title:
|
PROBE SYSTEMS FOR OPTICALLY PROBING A DEVICE UNDER TEST AND METHODS OF OPERATING THE PROBE SYSTEMS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/26/2022
|
Application #:
|
17028102
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Filing Dt:
|
09/22/2020
|
|
Publication #:
|
|
Pub Dt:
|
04/01/2021
| | | | |
|
Title:
|
PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWEEN AN OPTICAL PROBE OF A PROBE SYSTEM AND A CALIBRATION STRUCTURE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/31/2022
|
Application #:
|
17076279
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Filing Dt:
|
10/21/2020
|
|
Publication #:
|
|
Pub Dt:
|
05/06/2021
| | | | |
|
Title:
|
PROBE SYSTEMS AND METHODS FOR TESTING A DEVICE UNDER TEST
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/16/2024
|
Application #:
|
17078778
|
Filing Dt:
|
10/23/2020
|
|
Publication #:
|
|
Pub Dt:
|
05/06/2021
| | | | |
|
Title:
|
PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATORS, AND RELATED METHODS
|
|
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
17090715
|
Filing Dt:
|
11/05/2020
|
|
Publication #:
|
|
Pub Dt:
|
06/10/2021
| | | | |
|
Title:
|
CUSTOMIZABLE PROBE CARDS, PROBE SYSTEMS INCLUDING THE SAME, AND RELATED METHODS
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/05/2022
|
Application #:
|
17111283
|
Filing Dt:
|
12/03/2020
|
|
Publication #:
|
|
Pub Dt:
|
06/24/2021
| | | | |
|
Title:
|
DOUBLE-SIDED PROBE SYSTEMS WITH THERMAL CONTROL SYSTEMS AND RELATED METHODS
|
|
