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Reel/Frame:034944/0711   Pages: 4
Recorded: 02/12/2015
Attorney Dkt #:2857.2210002
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
05/03/2016
Application #:
14261879
Filing Dt:
04/25/2014
Publication #:
Pub Dt:
08/21/2014
Title:
Substrate and Patterning Device for Use in Metrology, Metrology Method and Device Manufacturing Method
Assignors
1
Exec Dt:
03/01/2012
2
Exec Dt:
03/01/2012
3
Exec Dt:
03/01/2012
4
Exec Dt:
03/01/2012
5
Exec Dt:
03/01/2012
Assignee
1
DE RUN 6501
VELDHOVEN, NETHERLANDS NL - 5504 DR
Correspondence name and address
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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