Patent Assignment Details
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Reel/Frame: | 011502/0722 | |
| Pages: | 3 |
| | Recorded: | 01/23/2001 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/13/2002
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Application #:
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09603592
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Filing Dt:
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06/26/2000
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Title:
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METHOD AND SYSTEM FOR SEMICONDUCTOR TESTING USING YIELD CORRELATION BETWEEN GLOBAL AND CLASS PARAMETERS
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Assignee
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1730 NORTH FIRST STREET |
SAN JOSE, CALIFORNIA 95112 |
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Correspondence name and address
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SIEMENS CORPORATION
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ELSA KELLER
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INTELLECTUAL PROPERTY DEPARTMENT
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186 WOOD AVENUE SOUTH
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ISELIN, NJ 08830
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