Total properties:
31
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Patent #:
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Issue Dt:
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03/10/2020
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Application #:
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15320406
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Filing Dt:
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12/20/2016
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Publication #:
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Pub Dt:
|
06/08/2017
| | | | |
Title:
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ANALYSIS DEVICE AND ANALYSIS METHOD
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Patent #:
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NONE
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Issue Dt:
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Application #:
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15326201
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Filing Dt:
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01/13/2017
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Publication #:
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Pub Dt:
|
07/27/2017
| | | | |
Title:
|
TEMPERATURE REGULATING CONTAINER
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|
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Patent #:
|
|
Issue Dt:
|
10/06/2020
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Application #:
|
15544302
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Filing Dt:
|
07/18/2017
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Publication #:
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Pub Dt:
|
01/11/2018
| | | | |
Title:
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TEST DEVICE
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Patent #:
|
|
Issue Dt:
|
04/28/2020
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Application #:
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15580231
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Filing Dt:
|
12/06/2017
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Publication #:
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Pub Dt:
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05/31/2018
| | | | |
Title:
|
CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD OF CHARGED PARTICLE BEAM DEVICE
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|
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Patent #:
|
|
Issue Dt:
|
10/13/2020
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Application #:
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15760498
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Filing Dt:
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03/15/2018
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Publication #:
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Pub Dt:
|
09/06/2018
| | | | |
Title:
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VACUUM APPARATUS
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Patent #:
|
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Issue Dt:
|
09/22/2020
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Application #:
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15777121
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Filing Dt:
|
05/17/2018
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Publication #:
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|
Pub Dt:
|
12/06/2018
| | | | |
Title:
|
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
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|
|
Patent #:
|
|
Issue Dt:
|
09/28/2021
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Application #:
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16012423
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Filing Dt:
|
06/19/2018
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Publication #:
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|
Pub Dt:
|
10/18/2018
| | | | |
Title:
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ION MILLING DEVICE
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|
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Patent #:
|
|
Issue Dt:
|
07/13/2021
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Application #:
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16070790
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Filing Dt:
|
07/18/2018
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Publication #:
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Pub Dt:
|
01/24/2019
| | | | |
Title:
|
CHARGED PARTICLE DETECTOR INCLUDING A LIGHT-EMITTING SECTION HAVING LAMINATION STRUCTURE, CHARGED PARTICLE BEAM DEVICE, AND MASS SPECTROMETER.
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|
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Patent #:
|
|
Issue Dt:
|
07/05/2022
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Application #:
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16071956
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Filing Dt:
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07/23/2018
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Publication #:
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Pub Dt:
|
01/31/2019
| | | | |
Title:
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BASE SEQUENCE DETERMINATION APPARATUS, CAPILLARY ARRAY ELECTROPHORESIS APPARATUS, AND METHOD
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Patent #:
|
|
Issue Dt:
|
10/20/2020
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Application #:
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16090991
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Filing Dt:
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10/03/2018
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Publication #:
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Pub Dt:
|
05/09/2019
| | | | |
Title:
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DEFECT CLASSIFICATION APPARATUS AND DEFECT CLASSIFICATION METHOD
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|
Patent #:
|
|
Issue Dt:
|
06/23/2020
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Application #:
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16251563
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Filing Dt:
|
01/18/2019
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Publication #:
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|
Pub Dt:
|
10/17/2019
| | | | |
Title:
|
MEASUREMENT AND INSPECTION DEVICE
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|
|
Patent #:
|
|
Issue Dt:
|
09/08/2020
|
Application #:
|
16260988
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Filing Dt:
|
01/29/2019
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Publication #:
|
|
Pub Dt:
|
08/01/2019
| | | | |
Title:
|
DEFECT OBSERVATION DEVICE
|
|
|
Patent #:
|
|
Issue Dt:
|
04/13/2021
|
Application #:
|
16261909
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Filing Dt:
|
01/30/2019
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Publication #:
|
|
Pub Dt:
|
08/29/2019
| | | | |
Title:
|
WAFER OBSERVATION DEVICE
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|
|
Patent #:
|
|
Issue Dt:
|
02/22/2022
|
Application #:
|
16316289
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Filing Dt:
|
01/08/2019
|
Publication #:
|
|
Pub Dt:
|
09/16/2021
| | | | |
Title:
|
ION MILLING APPARATUS
|
|
|
Patent #:
|
|
Issue Dt:
|
09/08/2020
|
Application #:
|
16319839
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Filing Dt:
|
01/23/2019
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Publication #:
|
|
Pub Dt:
|
08/29/2019
| | | | |
Title:
|
ELECTROLYTE CONCENTRATION MEASUREMENT DEVICE
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|
|
Patent #:
|
|
Issue Dt:
|
06/30/2020
|
Application #:
|
16325590
|
Filing Dt:
|
02/14/2019
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Publication #:
|
|
Pub Dt:
|
06/13/2019
| | | | |
Title:
|
SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND APPARATUS FOR MEASURING PARTICLES
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|
|
Patent #:
|
|
Issue Dt:
|
07/28/2020
|
Application #:
|
16325613
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Filing Dt:
|
02/14/2019
|
Publication #:
|
|
Pub Dt:
|
07/11/2019
| | | | |
Title:
|
CHARGED PARTICLE BEAM DEVICE AND ABERRATION CORRECTION METHOD FOR CHARGED PARTICLE BEAM DEVICE
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|
|
Patent #:
|
|
Issue Dt:
|
07/07/2020
|
Application #:
|
16325662
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Filing Dt:
|
02/14/2019
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Publication #:
|
|
Pub Dt:
|
07/04/2019
| | | | |
Title:
|
MEASURING DEVICE AND MEASURING METHOD
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
16328150
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Filing Dt:
|
02/25/2019
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Publication #:
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|
Pub Dt:
|
06/27/2019
| | | | |
Title:
|
ELECTRON SOURCE AND ELECTRON BEAM IRRADIATION DEVICE
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|
|
Patent #:
|
|
Issue Dt:
|
12/08/2020
|
Application #:
|
16329576
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Filing Dt:
|
02/28/2019
|
Publication #:
|
|
Pub Dt:
|
07/04/2019
| | | | |
Title:
|
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
|
|
|
Patent #:
|
|
Issue Dt:
|
07/28/2020
|
Application #:
|
16330003
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Filing Dt:
|
03/01/2019
|
Publication #:
|
|
Pub Dt:
|
07/04/2019
| | | | |
Title:
|
IMAGE ANALYSIS APPARATUS AND CHARGED PARTICLE BEAM APPARATUS
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|
|
Patent #:
|
|
Issue Dt:
|
07/21/2020
|
Application #:
|
16332212
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Filing Dt:
|
03/11/2019
|
Publication #:
|
|
Pub Dt:
|
11/28/2019
| | | | |
Title:
|
ELECTRON MICROSCOPE DEVICE AND INCLINED HOLE MEASUREMENT METHOD USING SAME
|
|
|
Patent #:
|
|
Issue Dt:
|
12/22/2020
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Application #:
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16337791
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Filing Dt:
|
03/28/2019
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Publication #:
|
|
Pub Dt:
|
01/02/2020
| | | | |
Title:
|
CHARGED PARTICLE BEAM DEVICE
|
|
|
Patent #:
|
|
Issue Dt:
|
12/22/2020
|
Application #:
|
16340401
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Filing Dt:
|
04/09/2019
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Publication #:
|
|
Pub Dt:
|
08/01/2019
| | | | |
Title:
|
DIAGNOSTIC IMAGING ASSISTANCE APPARATUS AND SYSTEM, AND DIAGNOSTIC IMAGING ASSISTANCE METHOD
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|
|
Patent #:
|
NONE
|
Issue Dt:
|
11/22/2022
|
Application #:
|
16472129
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Filing Dt:
|
06/20/2019
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Publication #:
|
|
Pub Dt:
|
10/17/2019
| | | | |
Title:
|
AUTOMATED ANALYSIS DEVICE
|
|
|
Patent #:
|
|
Issue Dt:
|
09/20/2022
|
Application #:
|
16476860
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Filing Dt:
|
07/09/2019
|
Publication #:
|
|
Pub Dt:
|
11/21/2019
| | | | |
Title:
|
CURRENT MEASUREMENT DEVICE AND CURRENT MEASUREMENT METHOD USING NANOPORE
|
|
|
Patent #:
|
|
Issue Dt:
|
09/28/2021
|
Application #:
|
16557175
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Filing Dt:
|
08/30/2019
|
Publication #:
|
|
Pub Dt:
|
03/05/2020
| | | | |
Title:
|
PATTERN INSPECTION SYSTEM
|
|
|
Patent #:
|
|
Issue Dt:
|
09/01/2020
|
Application #:
|
16576252
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Filing Dt:
|
09/19/2019
|
Publication #:
|
|
Pub Dt:
|
01/09/2020
| | | | |
Title:
|
CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED PARTICLE BEAM APPARATUS, AND PROGRAM
|
|
|
Patent #:
|
|
Issue Dt:
|
06/13/2023
|
Application #:
|
16603445
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Filing Dt:
|
10/07/2019
|
Title:
|
IMAGE DIAGNOSIS ASSISTING APPARATUS, IMAGE DIAGNOSIS ASSISTING SYSTEM AND IMAGE DIAGNOSIS ASSISTING METHOD
|
|
|
Patent #:
|
|
Issue Dt:
|
11/10/2020
|
Application #:
|
16616069
|
Filing Dt:
|
11/22/2019
|
Title:
|
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
|
|
|
Patent #:
|
|
Issue Dt:
|
09/01/2020
|
Application #:
|
16673456
|
Filing Dt:
|
11/04/2019
|
Publication #:
|
|
Pub Dt:
|
02/27/2020
| | | | |
Title:
|
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED PARTICLE BEAM DEVICE
|
|