Patent Assignment Details
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| Reel/Frame: | 012160/0740 | |
| Pages: | 4 |
| | Recorded: | 09/07/2001 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/11/2006
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Application #:
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09949111
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Filing Dt:
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09/07/2001
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Publication #:
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Pub Dt:
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11/21/2002
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Title:
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WAFER COLOR VARIATION CORRECTING METHOD, SELECTIVE WAFER DEFECT DETECTING METHOD, AND COMPUTER READABLE RECORDING MEDIA FOR THE SAME
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Assignee
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| 416, MAETAN-DONG, PALDAL-GU |
| SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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Correspondence name and address
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MILLS & ONELLO LLP
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ANTHONY P. ONELLO, JR.
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ELEVEN BEACON ST., SUITE 605
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BOSTON, MA 02108
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