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Reel/Frame:020396/0744   Pages: 3
Recorded: 01/22/2008
Attorney Dkt #:VISTEC
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
01/24/2012
Application #:
12014359
Filing Dt:
01/15/2008
Publication #:
Pub Dt:
08/28/2008
Title:
APPARATUS AND METHOD FOR MEASURING STRUCTURES ON A MASK AND OR FOR CALCULATING STRUCTURES IN A PHOTORESIST RESULTING FROM THE STRUCTURES
Assignor
1
Exec Dt:
01/07/2008
Assignee
1
KUBACHER WEG 4
WEILBURG, GERMANY 35781
Correspondence name and address
MARIA M. ELISEEVA
HOUSTON ELISEEVA LLP
4 MILITIA DRIVE, SUITE 4
LEXINGTON, MA 02421

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