Patent Assignment Details
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Reel/Frame: | 016077/0748 | |
| Pages: | 3 |
| | Recorded: | 06/03/2004 | | |
Attorney Dkt #: | 042412 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/29/2006
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Application #:
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10497514
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Filing Dt:
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06/03/2004
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Publication #:
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Pub Dt:
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04/14/2005
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Title:
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TESTING METHOD AND TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE COMPRISING HIGH-SPEED INPUT/OUTPUT ELEMENT
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Assignee
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1-8 HONCHOU 4-CHOME, KAWAGUCHI-SHI |
SAITAMA 332-0012, JAPAN |
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Correspondence name and address
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WESTERMAN, HATTORI, DANIELS & ADRIAN, LL
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1250 CONNECTICUT AVENUE, NW
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SUITE 700
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WASHINGTON, DC 20036
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