Patent Assignment Details
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| Reel/Frame: | 009727/0753 | |
| Pages: | 3 |
| | Recorded: | 01/25/1999 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/14/2001
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Application #:
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09237181
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Filing Dt:
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01/25/1999
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Title:
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METHOD AND SYSTEM FOR DETERMINING THE FAIL PATTERNS OF FABRICATED WAFERS IN AUTOMATED WAFER ACCEPTANCE TEST
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Assignees
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| 3F, NO. 19, LI HSIN RD., SCIENCE BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN R.O.C |
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| NO. 19, LIN HSIN RD., SCIENCE BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN R.O.C |
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| WITTELSBACHERPLATZ 2 |
| D-80333 MUNCHEN, GERMANY |
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Correspondence name and address
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J.C. PATENTS, INC.
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JIAWEI HUANG
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1340 REYNOLDS AVENUE, SUITE 114
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IRVINE, CA 92614
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