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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:019385/0760   Pages: 3
Recorded: 06/05/2007
Attorney Dkt #:308603US2SD
Conveyance: CORPORATE ADDRESS CHANGE
Total properties: 26
1
Patent #:
7275006
Issue Dt:
09/25/2007
Application #:
11265180
Filing Dt:
11/03/2005
Publication #:
US20070055467
Pub Dt:
03/08/2007
Title:
WORKPIECE INSPECTION APPARATUS ASSISTING DEVICE, WORKPIECE INSPECTION METHOD AND COMPUTER-READABLE RECORDING MEDIA STORING PROGRAM THEREFOR
2
Patent #:
7630535
Issue Dt:
12/08/2009
Application #:
11276426
Filing Dt:
02/28/2006
Publication #:
US20070071307
Pub Dt:
03/29/2007
Title:
DIE-TO-DIE PHOTOMASK DEFECT DETECTION USING REGION DATA TO MODIFY INSPECTION THRESHOLDS
3
Patent #:
7539222
Issue Dt:
05/26/2009
Application #:
11278637
Filing Dt:
04/04/2006
Publication #:
US20070071042
Pub Dt:
03/29/2007
Title:
METHOD OF OPERATING LASER LIGHT SOURCE
4
Patent #:
7664308
Issue Dt:
02/16/2010
Application #:
11283755
Filing Dt:
11/22/2005
Publication #:
US20070047798
Pub Dt:
03/01/2007
Title:
PHOTOMASK INSPECTION APPARATUS COMPARING OPTICAL PROXIMITY CORRECTION PATTERNS TO MINIMUM AND MAXIMUM LIMITS
5
Patent #:
7639863
Issue Dt:
12/29/2009
Application #:
11284186
Filing Dt:
11/22/2005
Publication #:
US20070047799
Pub Dt:
03/01/2007
Title:
DIE-TO-DATABASE PHOTOMASK DEFECT DETECTION USING REGION DATA TO MODIFY INSPECTION THRESHOLDS
6
Patent #:
7577288
Issue Dt:
08/18/2009
Application #:
11287419
Filing Dt:
11/28/2005
Publication #:
US20070053582
Pub Dt:
03/08/2007
Title:
SAMPLE INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, AND PROGRAM-RECORDED READABLE RECORDING MEDIUM
7
Patent #:
NONE
Issue Dt:
Application #:
11298608
Filing Dt:
12/12/2005
Publication #:
US20070053583
Pub Dt:
03/08/2007
Title:
Image correcting apparatus, pattern inspection apparatus, and image correcting method, and reticle
8
Patent #:
NONE
Issue Dt:
Application #:
11298720
Filing Dt:
12/12/2005
Publication #:
US20070052960
Pub Dt:
03/08/2007
Title:
Reference image forming apparatus, pattern inspection apparatus, and reference image forming method which use feature data
9
Patent #:
7643668
Issue Dt:
01/05/2010
Application #:
11299847
Filing Dt:
12/13/2005
Publication #:
US20070071308
Pub Dt:
03/29/2007
Title:
WORKPIECE INSPECTION APPARATUS, WORKPIECE INSPECTION METHOD AND COMPUTER-READABLE RECORDING MEDIUM STORING PROGRAM
10
Patent #:
7495756
Issue Dt:
02/24/2009
Application #:
11299848
Filing Dt:
12/13/2005
Publication #:
US20070064223
Pub Dt:
03/22/2007
Title:
PATTERN INSPECTION APPARATUS
11
Patent #:
NONE
Issue Dt:
Application #:
11304664
Filing Dt:
12/16/2005
Publication #:
US20070053578
Pub Dt:
03/08/2007
Title:
Pattern inspection apparatus and method and reticle for use therein
12
Patent #:
NONE
Issue Dt:
Application #:
11338708
Filing Dt:
01/25/2006
Publication #:
US20070064998
Pub Dt:
03/22/2007
Title:
Pattern inspection apparatus, pattern inspection method, and inspection sample
13
Patent #:
7388660
Issue Dt:
06/17/2008
Application #:
11344205
Filing Dt:
02/01/2006
Publication #:
US20070081149
Pub Dt:
04/12/2007
Title:
LIGHT AMOUNT MEASUREMENT DEVICE AND LIGHT AMOUNT MEASUREMENT METHOD
14
Patent #:
7487491
Issue Dt:
02/03/2009
Application #:
11360580
Filing Dt:
02/24/2006
Publication #:
US20070064993
Pub Dt:
03/22/2007
Title:
PATTERN INSPECTION SYSTEM USING IMAGE CORRECTION SCHEME WITH OBJECT-SENSITIVE AUTOMATIC MODE SWITCHABILITY
15
Patent #:
7706623
Issue Dt:
04/27/2010
Application #:
11360581
Filing Dt:
02/24/2006
Publication #:
US20060215899
Pub Dt:
09/28/2006
Title:
IMAGE CORRECTING METHOD
16
Patent #:
7539350
Issue Dt:
05/26/2009
Application #:
11360584
Filing Dt:
02/24/2006
Publication #:
US20060215900
Pub Dt:
09/28/2006
Title:
IMAGE CORRECTION METHOD
17
Patent #:
7627164
Issue Dt:
12/01/2009
Application #:
11360657
Filing Dt:
02/24/2006
Publication #:
US20070064994
Pub Dt:
03/22/2007
Title:
PATTERN INSPECTION METHOD AND APPARATUS WITH HIGH-ACCURACY PATTERN IMAGE CORRECTION CAPABILITY
18
Patent #:
7565032
Issue Dt:
07/21/2009
Application #:
11360679
Filing Dt:
02/24/2006
Publication #:
US20070064995
Pub Dt:
03/22/2007
Title:
IMAGE DENSITY-ADAPTED AUTOMATIC MODE SWITCHABLE PATTERN CORRECTION SCHEME FOR WORKPIECE INSPECTION
19
Patent #:
7627165
Issue Dt:
12/01/2009
Application #:
11360813
Filing Dt:
02/24/2006
Publication #:
US20070064996
Pub Dt:
03/22/2007
Title:
PATTERN INSPECTION METHOD AND APPARATUS USING LINEAR PREDICTIVE MODEL-BASED IMAGE CORRECTION TECHNIQUE
20
Patent #:
NONE
Issue Dt:
Application #:
11378333
Filing Dt:
03/20/2006
Publication #:
US20070146707
Pub Dt:
06/28/2007
Title:
Pattern inspection apparatus and method along with workpiece tested thereby and management method of workpiece under testing
21
Patent #:
NONE
Issue Dt:
Application #:
11378644
Filing Dt:
03/20/2006
Publication #:
US20070165938
Pub Dt:
07/19/2007
Title:
Pattern inspection apparatus and method and workpiece tested thereby
22
Patent #:
NONE
Issue Dt:
Application #:
11386744
Filing Dt:
03/23/2006
Publication #:
US20060222233
Pub Dt:
10/05/2006
Title:
Pattern defect inspection method and apparatus using image correction technique
23
Patent #:
7756318
Issue Dt:
07/13/2010
Application #:
11560039
Filing Dt:
11/15/2006
Publication #:
US20070292014
Pub Dt:
12/20/2007
Title:
PATTERN INSPECTION APPARATUS AND METHOD WITH LOCAL CRITICAL DIMENSION ERROR DETECTABILITY
24
Patent #:
7764825
Issue Dt:
07/27/2010
Application #:
11567520
Filing Dt:
12/06/2006
Publication #:
US20080050007
Pub Dt:
02/28/2008
Title:
PATTERN INSPECTION APPARATUS AND METHOD WITH ENHANCED TEST IMAGE CORRECTABILITY USING FREQUENCY DIVISION SCHEME
25
Patent #:
7796803
Issue Dt:
09/14/2010
Application #:
11567550
Filing Dt:
12/06/2006
Publication #:
US20080050008
Pub Dt:
02/28/2008
Title:
IMAGE CORRECTION METHOD AND APPARATUS FOR USE IN PATTERN INSPECTION SYSTEM
26
Patent #:
7655904
Issue Dt:
02/02/2010
Application #:
11678748
Filing Dt:
02/26/2007
Publication #:
US20080036899
Pub Dt:
02/14/2008
Title:
TARGET WORKPIECE INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, AND COMPUTER-READABLE RECORDING MEDIUM WITH PROGRAM RECORDED THEREON
Assignor
1
ADVANCED MASK INSPECTION TECHNOLOGY INC.
Exec Dt:
03/24/2007
Assignee
1
ADVANCED MASK INSPECTION TECHNOLOGY INC.
8, SHINSUGITA-CHO, ISOGO-KU
YOKOHAMA-SHI, KANAGAWA, JAPAN 235-0032
Correspondence name and address
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
1940 DUKE STREET
ALEXANDRIA, VA 22314

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